Show simple item record

Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope

dc.contributor.authorPicard, Robert G.en_US
dc.contributor.authorDuffendack, O. S.en_US
dc.date.accessioned2010-05-06T21:10:07Z
dc.date.available2010-05-06T21:10:07Z
dc.date.issued1943-06en_US
dc.identifier.citationPicard, Robert G.; Duffendack, O. S. (1943). "Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope." Journal of Applied Physics 14(6): 291-305. <http://hdl.handle.net/2027.42/69799>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69799
dc.description.abstractA study was made of thin films of aluminum, cadmium, copper, gold, magnesium, and zinc using an RCA electron microscope capable of 30A resolving power. The films were formed by evaporation and condensation on collodion substrates in vacuum. An evaporating chamber was devised that permitted control of the temperature of the condensing surface. Photographs of the surfaces show that all the films are made of agglomerates of the metals separated by interstices of various widths. All evidence leads to the conclusion that the surface structure is explainable by assuming migration of the atoms over the surface. The observed structure can be used to explain the electrical conductivity, the optical reflectivity, and adsorptivity of thin films. Electron microscopic studies also provide a ready means of classifying surfaces according to the mobility of the atoms comprising them, and thus enable a rough estimate of the potential distribution over the surface to be made.en_US
dc.format.extent3102 bytes
dc.format.extent2704330 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleStudies on the Structure of Thin Metallic Films by Means of the Electron Microscopeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumHarrison M. Randall Laboratory of Physics, University of Michigan, Ann Arbor, Michiganen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69799/2/JAPIAU-14-6-291-1.pdf
dc.identifier.doi10.1063/1.1714989en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.identifier.citedreferenceE. T. S. Appleyard, Proc. Phys. Soc. 49, Extra Part, pp. 118–135 (1937).en_US
dc.identifier.citedreferenceJ. E. Lennard‐Jones, Trans. Faraday Soc. 28, 333–359 (1932).en_US
dc.identifier.citedreferenceW. Caldwell, J. App. Phys. 12, 779–781 (1941).en_US
dc.identifier.citedreferenceL. Marton, J. App. Phys. 12, 763 (1941).en_US
dc.identifier.citedreferenceJ. Hillier and R. F. Baker, Phys. Rev. 61, 722–3 (1942).en_US
dc.identifier.citedreferenceL. H. Germer, Phys. Rev. 56, 58–71 (1939).en_US
dc.identifier.citedreferenceJ. E. Lennard‐Jones, Trans. Faraday Soc. 28, 333–359 (1932).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.