Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope
dc.contributor.author | Picard, Robert G. | en_US |
dc.contributor.author | Duffendack, O. S. | en_US |
dc.date.accessioned | 2010-05-06T21:10:07Z | |
dc.date.available | 2010-05-06T21:10:07Z | |
dc.date.issued | 1943-06 | en_US |
dc.identifier.citation | Picard, Robert G.; Duffendack, O. S. (1943). "Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope." Journal of Applied Physics 14(6): 291-305. <http://hdl.handle.net/2027.42/69799> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/69799 | |
dc.description.abstract | A study was made of thin films of aluminum, cadmium, copper, gold, magnesium, and zinc using an RCA electron microscope capable of 30A resolving power. The films were formed by evaporation and condensation on collodion substrates in vacuum. An evaporating chamber was devised that permitted control of the temperature of the condensing surface. Photographs of the surfaces show that all the films are made of agglomerates of the metals separated by interstices of various widths. All evidence leads to the conclusion that the surface structure is explainable by assuming migration of the atoms over the surface. The observed structure can be used to explain the electrical conductivity, the optical reflectivity, and adsorptivity of thin films. Electron microscopic studies also provide a ready means of classifying surfaces according to the mobility of the atoms comprising them, and thus enable a rough estimate of the potential distribution over the surface to be made. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 2704330 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Harrison M. Randall Laboratory of Physics, University of Michigan, Ann Arbor, Michigan | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/69799/2/JAPIAU-14-6-291-1.pdf | |
dc.identifier.doi | 10.1063/1.1714989 | en_US |
dc.identifier.source | Journal of Applied Physics | en_US |
dc.identifier.citedreference | E. T. S. Appleyard, Proc. Phys. Soc. 49, Extra Part, pp. 118–135 (1937). | en_US |
dc.identifier.citedreference | J. E. Lennard‐Jones, Trans. Faraday Soc. 28, 333–359 (1932). | en_US |
dc.identifier.citedreference | W. Caldwell, J. App. Phys. 12, 779–781 (1941). | en_US |
dc.identifier.citedreference | L. Marton, J. App. Phys. 12, 763 (1941). | en_US |
dc.identifier.citedreference | J. Hillier and R. F. Baker, Phys. Rev. 61, 722–3 (1942). | en_US |
dc.identifier.citedreference | L. H. Germer, Phys. Rev. 56, 58–71 (1939). | en_US |
dc.identifier.citedreference | J. E. Lennard‐Jones, Trans. Faraday Soc. 28, 333–359 (1932). | en_US |
dc.owningcollname | Physics, Department of |
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