Lateral composition modulation in mixed anion multilayers
dc.contributor.author | Dorin, C. | en_US |
dc.contributor.author | Mirecki-Millunchick, Joanna | en_US |
dc.contributor.author | Wauchope, C. | en_US |
dc.date.accessioned | 2010-05-06T21:15:49Z | |
dc.date.available | 2010-05-06T21:15:49Z | |
dc.date.issued | 2002-10-28 | en_US |
dc.identifier.citation | Dorin, C.; Mirecki Millunchick, J.; Wauchope, C. (2002). "Lateral composition modulation in mixed anion multilayers." Applied Physics Letters 81(18): 3368-3370. <http://hdl.handle.net/2027.42/69861> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/69861 | |
dc.description.abstract | Lateral composition modulation on the group V sublattice has been observed in GaAs/GaSb short period superlattices. Cross sectional transmission electron microscopy and x-ray diffraction reciprocal space maps reveal that all structures are phase-separated with Sb compositions for the strongest modulated structure of x = 0.73x=0.73 in the Sb-rich regions, x = 0.55x=0.55 in the As-rich regions, and wavelengths 15 ⩽ Λ ⩽ 20 nm.15⩽Λ⩽20nm. The composition modulation observed in these films is not due to spinodal decomposition, because an alloy grown at the same conditions results in a homogeneous layer, but may be related to vertical stacking of quantum dots that nucleate during the growth of the structure. © 2002 American Institute of Physics. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 245422 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Lateral composition modulation in mixed anion multilayers | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 | en_US |
dc.contributor.affiliationum | Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor, Michigan 48109-2143 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/69861/2/APPLAB-81-18-3368-1.pdf | |
dc.identifier.doi | 10.1063/1.1517712 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
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