Show simple item record

Deflection microwave amplifier with field‐emitter arrays

dc.contributor.authorTang, Cha‐meien_US
dc.contributor.authorLau, Y. Y.en_US
dc.contributor.authorSwyden, T. A.en_US
dc.date.accessioned2010-05-06T21:18:01Z
dc.date.available2010-05-06T21:18:01Z
dc.date.issued1994-11-28en_US
dc.identifier.citationTang, Cha‐Mei; Lau, Y. Y.; Swyden, T. A. (1994). "Deflection microwave amplifier with field‐emitter arrays." Applied Physics Letters 65(22): 2881-2883. <http://hdl.handle.net/2027.42/69885>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69885
dc.description.abstractA new class of microwave and millimeter‐wave amplifiers, based on the deflection of collimated microscopic electron beams with high‐current density and low voltage from field‐emitter arrays, was analyzed. The deflection concept may be applied in two ways; as microelectronic amplifiers or as bunched beam cathodes to power conventional amplifier configurations such as klystrodes and traveling wave tubes. We found that the frequency fT, at which the short‐circuit current gain attains unit magnitude, depends only on the electron beam energy, current density, and emittance, and is independent of beamwidth and total current. The results indicate that field‐emitter arrays have the potential of making wideband deflection amplifiers at frequencies up to tens of GHz. © 1994 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent98652 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleDeflection microwave amplifier with field‐emitter arraysen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109‐2104en_US
dc.contributor.affiliationotherPlasma Physics Division, Naval Research Laboratory, Washington, DC 20375‐5346en_US
dc.contributor.affiliationotherOmega P, Inc., 2008 Yale Station, New Haven, Connecticut 06520en_US
dc.contributor.affiliationotherFM Technologies, Inc., Fairfax, Virginia 22032en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69885/2/APPLAB-65-22-2881-1.pdf
dc.identifier.doi10.1063/1.112522en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceR. K. Parker and R. H. Abrams, 1992 Government Microcircuit Applications Conference (GOMAC), Digest of Papers (U.S. GPO, Washington, 1992), Vol. XVIII, pp. 29–32.en_US
dc.identifier.citedreferenceC. A. Spindt, C. E. Holland, A. Rosengreen, and I. Brodie, J. Vac. Sci. Technol. B 11, 468 (1993).en_US
dc.identifier.citedreferenceC. M. Tang, Y. Y. Lau, and T. A. Swyden, J. Vac. Sci. Technol. B (to be published).en_US
dc.identifier.citedreferenceC. M. Tang, Y. Y. Lau, and T. A. Swyden, Technical Digest of the 1993 IEEE International Electronics Devices Meeting, Washington, DC, 5–8 December 1993 (unpublished), pp. 757–760.en_US
dc.identifier.citedreferenceH. F. Gray, U.S. Patent 5, 030,895 (9, July, 1991).en_US
dc.identifier.citedreferenceW. L. Ohlinger and L. R. Barnett, Technical Digest of the Fourth International Vacuum Microelectronics Conference, Nagahama, Japan, 22–24 August 1991 (unpublished), pp. 110–111.en_US
dc.identifier.citedreferenceG. R. Kilgore, RCA Rev. VIII, 480 (1947).en_US
dc.identifier.citedreferenceR. Adler, U.S. Patent No. 2, 553,735 (22 May, 1951).en_US
dc.identifier.citedreferenceR. Adler (private communications).en_US
dc.identifier.citedreferenceC. Bozler, C. T. Harris, S. Rabe, D. D. Rathman, M. A. Hollis, and H. I. Smith, J. Vac. Sci. Technol. B 12, 629 (1994).en_US
dc.identifier.citedreferenceW. B. Herrmannsfeldt, EGUN—An Electron Optics and Gun Design Program, SLAC Report No. 331, 1988.en_US
dc.identifier.citedreferenceMAGIC Code, Mission Research Corporation, Newington, VA 22122.en_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.