1.9 picosecond high‐sensitivity sampling optical temporal analyzer

Chen, Yi; Williamson, Steven; Brock, Tim

1.9 picosecond high‐sensitivity sampling optical temporal analyzer

dc.contributor.author	Chen, Yi	en_US
dc.contributor.author	Williamson, Steven	en_US
dc.contributor.author	Brock, Tim	en_US
dc.date.accessioned	2010-05-06T21:18:29Z
dc.date.available	2010-05-06T21:18:29Z
dc.date.issued	1994-01-31	en_US
dc.identifier.citation	Chen, Yi; Williamson, Steve; Brock, Tim (1994). "1.9 picosecond high‐sensitivity sampling optical temporal analyzer." Applied Physics Letters 64(5): 551-553. <http://hdl.handle.net/2027.42/69890>	en_US
dc.identifier.uri	https://hdl.handle.net/2027.42/69890
dc.description.abstract	An all solid‐state, high‐sensitivity sampling optical temporal analyzer has been demonstrated by integrating two interdigitated picosecond metal‐semiconductor‐metal photodetectors into a coplanar transmission line structure. The full width at half‐maximum of the response time is 1.9 ps. The noise equivalent optical power is 500 pW, and the dynamic range is more than 60 dB.	en_US
dc.format.extent	3102 bytes
dc.format.extent	370374 bytes
dc.format.mimetype	text/plain
dc.format.mimetype	application/pdf
dc.publisher	The American Institute of Physics	en_US
dc.rights	© The American Institute of Physics	en_US
dc.title	1.9 picosecond high‐sensitivity sampling optical temporal analyzer	en_US
dc.type	Article	en_US
dc.subject.hlbsecondlevel	Physics	en_US
dc.subject.hlbtoplevel	Science	en_US
dc.description.peerreviewed	Peer Reviewed	en_US
dc.contributor.affiliationum	Ultrafast Science Laboratory, University of Michigan, Ann Arbor, Michigan 48109‐2099	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/69890/2/APPLAB-64-5-551-1.pdf
dc.identifier.doi	10.1063/1.111100	en_US
dc.identifier.source	Applied Physics Letters	en_US
dc.identifier.citedreference	D. H. Austin, Appl. Phys. Lett. 26, 102 (1975).	en_US
dc.identifier.citedreference	K. D. Li, A. S. Hou, E. Ozbay, B. A. Auld, and D. M. Bloom, Appl. Phys. Lett. 61, 3104 (1992).	en_US
dc.identifier.citedreference	M. B. Ketchen, D. Grischkowsky, T. C. Chen, C. C. Chi, I. N. Duling, N. J. Halas, J.-M. Halbout, J. A. Kash, and G. P. Li, Appl. Phys. Lett. 48, 753 (1986).	en_US
dc.identifier.citedreference	Yi. Chen, Steve. Williamson, Tim. Brock, F. W. Smith, and A. R. Calawa, Appl. Phys. Lett. 59, 1984 (1991).	en_US
dc.identifier.citedreference	W. C. Nunnally and R. B. Hammond, Picosecond Optoelectronics Devices, edited by C. H. Lee (Academic, Orlando, Florida, 1984), p. 373–398.	en_US
dc.identifier.citedreference	M. Y. Frankel, J. F. Whitaker, G. A. Mourou, F. W. Smith, A. R. Calawa, IEEE Trans. Electron Devices ED-37, 2493 (1990).	en_US
dc.identifier.citedreference	S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981), p. 111.	en_US
dc.owningcollname	Physics, Department of

Files in this item

Name:: APPLAB-64-5-551-1.pdf
Size:: 361.6KB
Format:: PDF

View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.