View Item 

Show simple item record

Synthesis and properties of epitaxial thin films of c-axis oriented metastable four-layered hexagonal BaRuO3BaRuO3
dc.contributor.authorLee, M. K.en_US
dc.contributor.authorEom, Chang-Beomen_US
dc.contributor.authorTian, Weien_US
dc.contributor.authorPan, Xiaoqingen_US
dc.contributor.authorSmoak, M. C.en_US
dc.contributor.authorTsui, F.en_US
dc.contributor.authorKrajewski, J. J.en_US
dc.date.accessioned2010-05-06T21:21:00Z
dc.date.available2010-05-06T21:21:00Z
dc.date.issued2000-07-17en_US
dc.identifier.citationLee, M. K.; Eom, C. B.; Tian, W.; Pan, X. Q.; Smoak, M. C.; Tsui, F.; Krajewski, J. J. (2000). "Synthesis and properties of epitaxial thin films of c-axis oriented metastable four-layered hexagonal BaRuO3BaRuO3." Applied Physics Letters 77(3): 364-366. <http://hdl.handle.net/2027.42/69917>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69917
dc.description.abstractWe have grown epitaxial thin films of c-axis oriented metastable four-layered hexagonal BaRuO3BaRuO3 on a (111) SrTiO3SrTiO3 substrate by 90° off-axis sputtering techniques. X-ray diffraction and transmission electron microscopy reveal that the films are single domains of c-axis four-layered hexagonal structures with an in-plane epitaxial arrangement of BaRuO3BaRuO3 [20]∥SrTiO3[110].[21̄1̄0]∥SrTiO3[110]. Surfaces with smooth terraces having a step height of a half unit cell (∼4.7 Å) have been observed by scanning tunneling microscopy. The in-plane electrical resistivity of the films is metallic, with a room temperature value of 810 μΩ cm and slightly curved temperature dependence. Their magnetic susceptibility is Pauli paramagnetic. The metastable layered metallic oxide can be used for understanding new solid-state phenomena and device applications. © 2000 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent380931 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleSynthesis and properties of epitaxial thin films of c-axis oriented metastable four-layered hexagonal BaRuO3BaRuO3en_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherDepartment of Mechanical Engineering and Materials Science, Duke University, Durham, North Carolina 27708en_US
dc.contributor.affiliationotherDepartment of Physics and Astronomy, University of North Carolina, Chapel Hill, North Carolina 27599en_US
dc.contributor.affiliationotherBell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69917/2/APPLAB-77-3-364-1.pdf
dc.identifier.doi10.1063/1.126977en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceY. Maeno, H. Hashimoto, K. Yoshida, S. Nishizaki, T. Fujita, J. G. Bednorz, and F. Lichtenberg, Nature (London) NATUAS372, 532 (1994).en_US
dc.identifier.citedreferenceH. Kobayashi, M. Nagata, R. Kanno, and Y. Kawamoto, MRS Bull. MRSBEA29, 1271 (1994).en_US
dc.identifier.citedreferenceP. C. Donohue, L. Katz, and R. Ward, Inorg. Chem. INOCAJ4, 306 (1965).en_US
dc.identifier.citedreferenceJ. M. Longo and J. A. Kafalas, MRS Bull. MRBUAC3, 687 (1968).en_US
dc.identifier.citedreferenceJ. Lettieri, I. W. Scrymgeour, D. G. Schlom, M. K. Lee, and C. B. Eom (unpublished).en_US
dc.identifier.citedreferenceS. T. Hong and A. W. Sleight, J. Solid State Chem. JSSCBI128, 251 (1997).en_US
dc.identifier.citedreferenceJ. T. Rijssenbeek, R. Jin, Y. Zadorozhny, Y. Liu, B. Batlogg, and R. J. Cava, Phys. Rev. B PRBMDO59, 4561 (1999).en_US
dc.identifier.citedreferenceC. B. Eom, R. J. Cava, R. M. Fleming, J. M. Phillips, R. B. van Dover, J. H. Marshall, J. W. P. Hsu, J. J. Krajewski, and W. F. Peck, Jr., Science SCIEAS258, 1766 (1992).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Name:
APPLAB-77-3-364-1.pdf
Size:
372.0KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.