View Item 

Show simple item record

Erratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]
dc.contributor.authorMcGregor, Douglas S.en_US
dc.contributor.authorRojeski, Ronald A.en_US
dc.contributor.authorKnoll, Glenn F.en_US
dc.contributor.authorTerry, Fred L. Jr.en_US
dc.contributor.authorEast, Jack Royen_US
dc.contributor.authorEisen, Yosefen_US
dc.date.accessioned2010-05-06T21:27:19Z
dc.date.available2010-05-06T21:27:19Z
dc.date.issued1995-02-01en_US
dc.identifier.citationMcGregor, Douglas S.; Rojeski, Ronald A.; Knoll, Glenn F.; Terry, Fred L.; East, Jack; Eisen, Yosef (1995). "Erratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]." Journal of Applied Physics 77(3): 1331-1331. <http://hdl.handle.net/2027.42/69985>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69985
dc.format.extent3102 bytes
dc.format.extent64833 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleErratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]en_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherSoreq Nuclear Research Center, Israel Atomic Energy Commission, Yavne 70600, Israelen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69985/2/JAPIAU-77-3-1331-1.pdf
dc.identifier.doi10.1063/1.359609en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


Files in this item

Name:
JAPIAU-77-3-1331-1.pdf
Size:
63.31KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe its collections in a way that respects the people and communities who create, use, and are represented in them. We encourage you to Contact Us anonymously if you encounter harmful or problematic language in catalog records or finding aids. More information about our policies and practices is available at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.