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Erratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]
dc.contributor.authorMcGregor, Douglas S.en_US
dc.contributor.authorRojeski, Ronald A.en_US
dc.contributor.authorKnoll, Glenn F.en_US
dc.contributor.authorTerry, Fred L. Jr.en_US
dc.contributor.authorEast, Jack Royen_US
dc.contributor.authorEisen, Yosefen_US
dc.date.accessioned2010-05-06T21:27:19Z
dc.date.available2010-05-06T21:27:19Z
dc.date.issued1995-02-01en_US
dc.identifier.citationMcGregor, Douglas S.; Rojeski, Ronald A.; Knoll, Glenn F.; Terry, Fred L.; East, Jack; Eisen, Yosef (1995). "Erratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]." Journal of Applied Physics 77(3): 1331-1331. <http://hdl.handle.net/2027.42/69985>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69985
dc.format.extent3102 bytes
dc.format.extent64833 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleErratum: ‘‘Evidence for field enhanced electron capture by EL2 centers in semi‐insulating GaAs and the effect on GaAs radiation detectors’’ [J. Appl. Phys. 75, 7910 (1994)]en_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherSoreq Nuclear Research Center, Israel Atomic Energy Commission, Yavne 70600, Israelen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69985/2/JAPIAU-77-3-1331-1.pdf
dc.identifier.doi10.1063/1.359609en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


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