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Resonant absorption of a short-pulse laser in a doped dielectric

dc.contributor.authorAng, L. K.en_US
dc.contributor.authorLau, Y. Y.en_US
dc.contributor.authorGilgenbach, Ronald M.en_US
dc.date.accessioned2010-05-06T21:40:13Z
dc.date.available2010-05-06T21:40:13Z
dc.date.issued1999-05-17en_US
dc.identifier.citationAng, L. K.; Lau, Y. Y.; Gilgenbach, R. M. (1999). "Resonant absorption of a short-pulse laser in a doped dielectric." Applied Physics Letters 74(20): 2912-2914. <http://hdl.handle.net/2027.42/70124>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70124
dc.description.abstractA simple model is used to calculate the energy absorption efficiency when a laser of short pulse length impinges on a dielectric slab that is doped with an impurity with a resonant line at the laser frequency. It is found that the energy absorption efficiency is maximized for a certain degree of doping concentration (at a given pulse length) and also for a certain pulselength (at a given doping concentration). Dimensionless parameters are constructed, allowing calculations with one set of parameters be used to infer the results expected for other sets of parameters. © 1999 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent155289 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleResonant absorption of a short-pulse laser in a doped dielectricen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2104en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70124/2/APPLAB-74-20-2912-1.pdf
dc.identifier.doi10.1063/1.123963en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceM. D. Perry and G. Mourou, Science SCIEAS264, 917 (1994).en_US
dc.identifier.citedreferenceJ. M. J. Madey, H. A. Schwettman, and W. M. Fairbank, IEEE Trans. Nucl. Sci. IETNAE20, 980 (1973).en_US
dc.identifier.citedreferenceC. W. Roberson and P. Sprangle, Phys. Fluids B PFBPEI1, 3 (1989); E. Esarey, P. Sprangle, J. Krall, and A. Ting, IEEE Trans. Plasma Sci. ITPSBDPS-24, 252 (1996).en_US
dc.identifier.citedreferenceM. Tabak, J. Hammer, M. E. Glinsky, W. L. Kruer, S. C. Wilks, J. Woodworth, E. M. Campbell, M. D. Perry, and R. J. Mason, Phys. Plasmas PHPAEN1, 1626 (1994).en_US
dc.identifier.citedreferenceX. Liu, D. Du, and G. Mourou, IEEE J. Quantum Electron. IEJQA733, 1706 (1997).en_US
dc.identifier.citedreferenceM. J. Kelley, Nucl. Instrum. Methods Phys. Res. B NIMBEU144, 186 (1998).en_US
dc.identifier.citedreferenceW. Kautek, S. Mitterer, J. Kruger, W. Husinsky, and G. Grabner, Appl. Phys. A: Solids Surf. APSFDB58, 513 (1994).en_US
dc.identifier.citedreferenceR. Srinivasan and B. Braren, Appl. Phys. A: Solids Surf. APSFDB45, 289 (1988).en_US
dc.identifier.citedreferenceP. L. G. Ventzek, R. M. Gilgenbach, C. H. Ching, R. A. Lindley, and W. B. McColl, J. Appl. Phys. JAPIAU72, 3080 (1992).en_US
dc.identifier.citedreferenceK. J. Hendricks, P. D. Coleman, R. W. Lemke, M. J. Arman, and L. Bowers, Phys. Rev. Lett. PRLTAO76, 154 (1996).en_US
dc.owningcollnamePhysics, Department of


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