Observation of incident angle dependent phonon absorption in hydrogenated amorphous silicon nitride thin films
dc.contributor.author | Li, Tong | en_US |
dc.contributor.author | Kanicki, Jerzy | en_US |
dc.date.accessioned | 2010-05-06T21:49:06Z | |
dc.date.available | 2010-05-06T21:49:06Z | |
dc.date.issued | 1998-12-28 | en_US |
dc.identifier.citation | Li, Tong; Kanicki, Jerzy (1998). "Observation of incident angle dependent phonon absorption in hydrogenated amorphous silicon nitride thin films." Applied Physics Letters 73(26): 3866-3868. <http://hdl.handle.net/2027.42/70219> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70219 | |
dc.description.abstract | We have demonstrated the existence of longitudinal- and transverse-like optical modes of Si–N bond in vibrational absorption spectrum of hydrogenated amorphous silicon nitride thin films. One of the longitudinal-like optical resonances coincides with the transverse-like mode of Si–O bond, and the other closely neighbors the bending mode of N–H bond. We have also shown that the conventionally assigned asymmetric stretching mode of Si–N bond is merely a transverse-like mode of the bond. The microstructures of both longitudinal- and transverse-like modes can well be apprehended by a p-polarized beam at an oblique incidence light, especially at Brewster angle incidence. The spectrum distortion induced by interference fringes can be eliminated at this condition. © 1998 American Institute of Physics. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 88281 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Observation of incident angle dependent phonon absorption in hydrogenated amorphous silicon nitride thin films | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Center for Display Technology and Manufacturing, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48105 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70219/2/APPLAB-73-26-3866-1.pdf | |
dc.identifier.doi | 10.1063/1.122919 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
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dc.owningcollname | Physics, Department of |
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