Electron diffraction studies of supersonic jets. V. Low temperature crystalline forms of SF6, SeF6, and TeF6
dc.contributor.author | Valente, Edward J. | en_US |
dc.contributor.author | Bartell, Lawrence S. | en_US |
dc.date.accessioned | 2010-05-06T21:50:20Z | |
dc.date.available | 2010-05-06T21:50:20Z | |
dc.date.issued | 1983-09-15 | en_US |
dc.identifier.citation | Valente, Edward J.; Bartell, Lawrence S. (1983). "Electron diffraction studies of supersonic jets. V. Low temperature crystalline forms of SF6, SeF6, and TeF6." The Journal of Chemical Physics 79(6): 2683-2686. <http://hdl.handle.net/2027.42/70232> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70232 | |
dc.description.abstract | Condensation of SF6, SeF6, and TeF6 in nozzle flows with inert carrier gases produces microcrystals of these materials. All form the higher temperature body‐centered cubic structure at higher partial pressures of hexafluoride. At lower partial pressures and colder nucleation conditions a lower symmetry form of each has been produced. Electron diffraction powder patterns are consistent with the space group Pnma to which metal hexafluorides of UF6 type belong. Low temperature phases of the present materials differ from those of the metal compounds, however, in being less dense than the cubic forms. Aspects of the gas dynamics affording a control over nucleated species are briefly discussed. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 277059 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Electron diffraction studies of supersonic jets. V. Low temperature crystalline forms of SF6, SeF6, and TeF6 | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70232/2/JCPSA6-79-6-2683-1.pdf | |
dc.identifier.doi | 10.1063/1.446172 | en_US |
dc.identifier.source | The Journal of Chemical Physics | en_US |
dc.identifier.citedreference | J. Michel, M. Drifford, and P. Rigny, J. Chim. Physiochim. Biol. 67, 31 (1970). | en_US |
dc.identifier.citedreference | S. Siegel and D. A. Northrup, Inorg. Chem. 5, 2187 (1966). | en_US |
dc.identifier.citedreference | J. H. Levy, J. C. Taylor, and P. W. Wilson, J. Chem. Soc. Dalton Trans. 1976, 219. | en_US |
dc.identifier.citedreference | P. R. Salvi and V. Shettino, Chem. Phys. 40, 413 (1980). | en_US |
dc.identifier.citedreference | G. Pawley and G. W. Thomas, Phys. Rev. Lett. 48, 410 (1982). | en_US |
dc.identifier.citedreference | B. G. DeBoer, S. S. Kim, and G. D. Stein, Rarefied Gas Dynamics, 11th International Symposium, edited by R. Campargue (Commissariat a L’Energie Atomique, Paris, 1979), pp. 1151–1160; S. S. Kim, Ph.D. dissertation, Northwestern University, 1981. | en_US |
dc.identifier.citedreference | O. Abraham, S. S. Kim, and G. D. Stein, J. Chem. Phys. 76, 402 (1981). | en_US |
dc.identifier.citedreference | L. S. Bartell, R. K. Heenan, and M. Nagashima, J. Chem. Phys. 78, 236 (1983). | en_US |
dc.identifier.citedreference | L. S. Bartell, L. O. Brockway, and R. H. Schwendeman, J. Chem. Phys. 23, 1854 (1955). | en_US |
dc.identifier.citedreference | A. Guinier, X‐ray Diffraction (Freeman, San Francisco, 1963), p. 121 ff. | en_US |
dc.identifier.citedreference | G. Dolling, B. M. Powell, and V. F. Sears, Mol. Phys. 37, 1859 (1979). | en_US |
dc.identifier.citedreference | G. D. Stein and P. P. Wegener, J. Chem. Phys. 46, 3665 (1967). | en_US |
dc.identifier.citedreference | L. B. Thomas, Fundamentals of Gas‐Surface Interactions, edited by H. Saltsburg, J. N. Smith, Jr., and M. Rogers (Academic, New York, 1967), p. 346 ff. | en_US |
dc.identifier.citedreference | E. J. Valente and L. S. Bartell (to be published). | en_US |
dc.owningcollname | Physics, Department of |
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