Show simple item record

Low‐temperature conductivity of epitaxial ZnSe in the impurity band regime

dc.contributor.authorVaziri, M.en_US
dc.date.accessioned2010-05-06T21:52:31Z
dc.date.available2010-05-06T21:52:31Z
dc.date.issued1994-11-14en_US
dc.identifier.citationVaziri, M. (1994). "Low‐temperature conductivity of epitaxial ZnSe in the impurity band regime." Applied Physics Letters 65(20): 2568-2570. <http://hdl.handle.net/2027.42/70255>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70255
dc.description.abstractLow‐temperature conductivity of several samples of ZnSe grown by molecular‐beam epitaxy has been measured. The data indicate that for samples with carrier concentration below or near Nc, metal insulator transition, the conductivity obeys σ=σ0 exp[−(T0/T)s] at low temperatures with s=1/2. This behavior is a characteristic of variable‐range hopping conduction in the presence of a Coulomb gap. © 1994 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent59508 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleLow‐temperature conductivity of epitaxial ZnSe in the impurity band regimeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics & Engineering Science, The University of Michigan–Flint, Flint, Michigan 48502en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70255/2/APPLAB-65-20-2568-1.pdf
dc.identifier.doi10.1063/1.112641en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceN. F. Mott, J. Non-Cryst. Solids 1, 1 (1968).en_US
dc.identifier.citedreferenceA. L. Efros and B. I. Shklovskii, J. Phys. C 8, L49 (1975).en_US
dc.identifier.citedreferenceA. L. Afros and B. I. Shklovskii, in Electron-Electron Interactions in Disordered System, edited by A. L. Afros and M. Pollak (North-Holland, Amsterdam, 1985), p. 435.en_US
dc.identifier.citedreferenceB. I. Shklovskii and A. L. Efros, in Electronic Properties of Doped Semiconductors, edited by M. Cardona (Springer, Berlin, 1984), p. 208.en_US
dc.identifier.citedreferenceReference 4, p. 81.en_US
dc.identifier.citedreferenceT. Marshall and J. Gaines, Appl. Phys. Lett. 56, 2669 (1990).en_US
dc.identifier.citedreferenceM. Vaziri, R. Reifenbeger, R. L. Gunshor, L. A. Kolodziejski, S. Venkatesan, and R. F. Pierret, J. Vac. Sci. Technol. B 7, 253 (1989).en_US
dc.identifier.citedreferenceH. E. Ruda, J. Appl. Phys. 59, 1220 (1986).en_US
dc.identifier.citedreferenceD. Walsh, K. Mazuruk, M. Benzaquen, and P. Weissfloch, Semicond. Sci. Technol. 3, 116 (1988).en_US
dc.identifier.citedreferenceF. Tremblay, M. Pepper, D. Ritchie, D. C. Peacock, J. E. F. Frost, and G. A. Jones, Phys. Rev. B 39, 8059 (1989).en_US
dc.identifier.citedreferenceY. Zhang, P. Dai, M. Levy, and M. P. Sarachik, Phys. Rev. Lett. 64, 2687 (1990).en_US
dc.owningcollnameInnovation and Technology, College of (UM-Flint)


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.