Laser beam deflection as a probe of laser ablation of materials
dc.contributor.author | Sell, Jeffrey A. | en_US |
dc.contributor.author | Heffelfinger, David M. | en_US |
dc.contributor.author | Ventzek, Peter L. G. | en_US |
dc.contributor.author | Gilgenbach, Ronald M. | en_US |
dc.date.accessioned | 2010-05-06T21:53:15Z | |
dc.date.available | 2010-05-06T21:53:15Z | |
dc.date.issued | 1989-12-04 | en_US |
dc.identifier.citation | Sell, Jeffrey A.; Heffelfinger, David M.; Ventzek, Peter; Gilgenbach, Ronald M. (1989). "Laser beam deflection as a probe of laser ablation of materials." Applied Physics Letters 55(23): 2435-2437. <http://hdl.handle.net/2027.42/70263> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70263 | |
dc.description.abstract | Helium‐neon laser beam deflection is used to study excimer laser ablation of polymers and a YBa2 Cu3 O7−x superconductor. Density gradients above pulsed laser heated or ablated samples deflect the He‐Ne laser beam and this is measured using a position sensitive detector. The technique permits the determination of the laser fluence threshold for ablation both in a vacuum and in air, and the velocity of the ablation products in a vacuum. A model of the thermal deflection at low fluence was developed which enables measurements of thermal diffusivity of the air. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 383814 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Laser beam deflection as a probe of laser ablation of materials | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Physics Department, General Motors Research Laboratories, Warren, Michigan 48090‐9055 | en_US |
dc.contributor.affiliationum | Intense Energy Beam Interaction Laboratory, Nuclear Engineering Department, University of Michigan, Ann Arbor, Michigan 48109‐2104 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70263/2/APPLAB-55-23-2435-1.pdf | |
dc.identifier.doi | 10.1063/1.102293 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
dc.identifier.citedreference | V. Srinivasen, M. A. Smertic, and S. V. Babu, J. Appl. Phys. 59, 3861 (1986). | en_US |
dc.identifier.citedreference | S. Lazare and V. Granier, J. Appl. Phys. 63, 2110 (1988). | en_US |
dc.identifier.citedreference | P. E. Dyer and J. Sidhu, J. Appl. Phys. 57, 1420 (1985). | en_US |
dc.identifier.citedreference | G. Gorodetsky, T. G. Kazyaka, R. L. Melcher, and R. Srinivasan, Appl. Phys. Lett. 46, 251 (1985). | en_US |
dc.identifier.citedreference | R. Srinivasan, B. Braren, and R. W. Dreyfus, J. Appl. Phys. 61, 372 (1987). | en_US |
dc.identifier.citedreference | S. Lazare and V. Granier, Laser Chem. 10, 25 (1989). | en_US |
dc.identifier.citedreference | J. H. Brannon, J. R. Lankard, A. I. Baise, F. Burns, and J. Kaufman, J. Appl. Phys. 58, 2036 (1985). | en_US |
dc.identifier.citedreference | D. Dijkkamp, T. Venkatesan, X. D. Wu, S. H. Shaheen, N. Jisrawi, Y.‐H. Min‐Lee, W. L. Mclean, and M. Croft, Appl. Phys. Lett. 51, 619 (1987). | en_US |
dc.identifier.citedreference | A. Inam, X. D. Wu, T. Venkatesan, S. B. Ogale, C. C. Chang, and D. Dijkkamp, Appl. Phys. Lett. 51, 1112 (1987). | en_US |
dc.identifier.citedreference | T. Venkatesan, X. D. Wu, A. Inam, and J. B. Wachtman, Appl. Phys. Lett. 52, 1193 (1988). | en_US |
dc.identifier.citedreference | P. E. Dyer, R. D. Greenough, A. Issa, and P. H. Key, Appl. Phys. Lett. 53, 534 (1988). | en_US |
dc.identifier.citedreference | W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier, Appl. Opt. 20, 1333 (1981). | en_US |
dc.identifier.citedreference | J. A. Sell, Appl. Opt. 24, 3725 (1985). | en_US |
dc.identifier.citedreference | J. A. Sell, “Fluid velocimetry using the photothermal deflection effect,” in Photothermal Investigations of Solids and Fluids, edited by J. A. Sell (Academic, Boston, 1989), p. 231. | en_US |
dc.identifier.citedreference | J. C. Murphy and L. C. Aamodt, J. Appl. Phys. 51, 4581 (1980). | en_US |
dc.identifier.citedreference | A. C. Tam and W. P. Leung, Phys. Rev. Lett. 53, 560 (1984). | en_US |
dc.identifier.citedreference | A. C. Tam and H. Schroeder, J. Appl. Phys. 64, 3667 (1988). | en_US |
dc.identifier.citedreference | G. Koren, Appl. Phys. Lett. 51, 569 (1987). | en_US |
dc.identifier.citedreference | C. L. Enloe, R. M. Gilgenbach, and J. S. Meachum, Rev. Sci. Instrum. 58, 1597 (1987).Also, C. L. Enloe, doctoral dissertation, University of Michigan, 1988. | en_US |
dc.identifier.citedreference | S. Petzoldt, A. P. Elg, M. Reichling, J. Reif, and E. Matthias, Appl. Phys. Lett. 53, 2005 (1988). | en_US |
dc.identifier.citedreference | L. C. Aamodt, (private communication). This expression can also be derived starting with equation 14.6.9 of H. S. Carslaw and J. C. Jaeger, Conduction of Heat in Solids, second edition, (Oxford Science, Oxford, 1986). | en_US |
dc.identifier.citedreference | Thermal Diffusivity, edited by Y. S. Touloukian, R. W. Powell, C. Y. Ho, and M. C. Nicolaou, (IFI∕Plenum, New York, 1973), p. 518. | en_US |
dc.identifier.citedreference | J. C. Loulergue and A. C. Tam, Appl. Phys. Lett. 46, 457 (1985). | en_US |
dc.identifier.citedreference | J. P. Zheng, Z. Q. Huang, D. T. Shaw, and H. S. Kwok, Appl. Phys. Lett. 54, 280 (1989). | en_US |
dc.owningcollname | Physics, Department of |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.