Show simple item record

Compact large‐range cryogenic scanner

dc.contributor.authorSiegel, Jeffreyen_US
dc.contributor.authorWitt, Jeffen_US
dc.contributor.authorVenturi, Naiaen_US
dc.contributor.authorField, Stuarten_US
dc.date.accessioned2010-05-06T21:54:24Z
dc.date.available2010-05-06T21:54:24Z
dc.date.issued1995-03en_US
dc.identifier.citationSiegel, Jeffrey; Witt, Jeff; Venturi, Naia; Field, Stuart (1995). "Compact large‐range cryogenic scanner." Review of Scientific Instruments 66(3): 2520-2523. <http://hdl.handle.net/2027.42/70275>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70275
dc.description.abstractWe describe the construction and operation of a large‐range piezoelectric scanner, suitable for various scanning probe microscopies such as magnetic force, atomic force, and Hall probe microscopies. The instrument is compact and inherently thermally compensated. At room temperature, it has a range of over 2 mm; this range is reduced to 275 μm at 4.2 K. © 1995 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent601308 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleCompact large‐range cryogenic scanneren_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, The University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70275/2/RSINAK-66-3-2520-1.pdf
dc.identifier.doi10.1063/1.1145652en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceG. Binnig and D. P. E. Smith, Rev. Sri. Instrum. 57, 1688 (1986).en_US
dc.identifier.citedreferenceG. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).en_US
dc.identifier.citedreferenceY. Martin and H. K. Wickramasinghe, Appl. Phys. Lett. 50, 1455 (1987).en_US
dc.identifier.citedreferenceE. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991).en_US
dc.identifier.citedreferenceA. M. Chang, H. D. Hallen, L. Harriot, H. F. Hess, H. L. Kao, R. E. Miller, R. Wolfe, J. van der Ziel, and T. Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).en_US
dc.identifier.citedreferenceR. García Cantú and M. A. Huerta Gamica, J. Vac. Sci. Technol. A 8, 354 (1990).en_US
dc.identifier.citedreferenceV. K. Adamchuk, A. V. Ermakov, and S. I. Fedoseenko, Ultramicroscopy 42–44, 1602 (1992).en_US
dc.identifier.citedreferenceM. O. Wantanabe, K. Tanaka, and A. Sakai, J. Vac. Sci. Technol. A 8, 327 (1990).en_US
dc.identifier.citedreferenceM. A. McCord and R. F. W. Pease, Appl. Phys. Lett. 50, 569 (1987).en_US
dc.identifier.citedreferenceP. Muralt, D. W. Pohl, and W. Denk, IBM J. Res. Devlop. 30, 443 (1986).en_US
dc.identifier.citedreferenceB. L. Blackford, D. C. Dahn, and M. H. Jericho, Rev. Sci. Instrum. 58, 1343 (1987).en_US
dc.identifier.citedreferenceJ. Burger, S. C. Meepagala, and E. L. Wolf, Rev. Sci. Instrum. 60, 735 (1989).en_US
dc.identifier.citedreferenceU. Dürig, D. Pohl, and F. Rohner, IBM J. Res. Devlop. 30, 478 (1986).en_US
dc.identifier.citedreferenceR. García Cantú and M. A. Huerta Garnica, Surf. Sci. 181, 216 (1987).en_US
dc.identifier.citedreferenceJ. E. Yao, J. He, G. Y. Shang, Y. L. Kuang, J. Wei, K. Zeng, K. C. Lin, J. W. Dai, and Y. X. Su., in International Symposium on Electron Microscopy, edited by K. Kuo and J. Yao (World Scientific, Singapore, 1991), p. 81.en_US
dc.identifier.citedreferenceD. A. Brawner and N. P. Ong, J. Appl. Phys. 73, 3890 (1993).en_US
dc.identifier.citedreferenceR. N. Goren and M. Tinkham, J. Low Temp. Phys. 5, 465 (1971).en_US
dc.identifier.citedreferenceFrom catalog, Vernitron Piezoelectric Division, Bedford, OH.en_US
dc.identifier.citedreferenceC. J. Chen, Appl. Phys. Lett. 60, 132 (1992).en_US
dc.identifier.citedreferenceR. D. Blevins, Formulas for Natural Frequency and Mode Shape (Krieger, Florida, 1979), p. 221.en_US
dc.identifier.citedreferenceM. E. Taylor, Rev. Sci. Instrum. 64, 154 (1993).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.