Compact large‐range cryogenic scanner
dc.contributor.author | Siegel, Jeffrey | en_US |
dc.contributor.author | Witt, Jeff | en_US |
dc.contributor.author | Venturi, Naia | en_US |
dc.contributor.author | Field, Stuart | en_US |
dc.date.accessioned | 2010-05-06T21:54:24Z | |
dc.date.available | 2010-05-06T21:54:24Z | |
dc.date.issued | 1995-03 | en_US |
dc.identifier.citation | Siegel, Jeffrey; Witt, Jeff; Venturi, Naia; Field, Stuart (1995). "Compact large‐range cryogenic scanner." Review of Scientific Instruments 66(3): 2520-2523. <http://hdl.handle.net/2027.42/70275> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70275 | |
dc.description.abstract | We describe the construction and operation of a large‐range piezoelectric scanner, suitable for various scanning probe microscopies such as magnetic force, atomic force, and Hall probe microscopies. The instrument is compact and inherently thermally compensated. At room temperature, it has a range of over 2 mm; this range is reduced to 275 μm at 4.2 K. © 1995 American Institute of Physics. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 601308 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Compact large‐range cryogenic scanner | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Physics, The University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70275/2/RSINAK-66-3-2520-1.pdf | |
dc.identifier.doi | 10.1063/1.1145652 | en_US |
dc.identifier.source | Review of Scientific Instruments | en_US |
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dc.owningcollname | Physics, Department of |
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