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A field‐sensitive photoconductive probe for sampling through passivation layers

dc.contributor.authorHwang, Jiunn‐Renen_US
dc.contributor.authorLai, Richard K.en_US
dc.contributor.authorNees, John A.en_US
dc.contributor.authorNorris, Theodore B.en_US
dc.contributor.authorWhitaker, John F.en_US
dc.date.accessioned2010-05-06T21:57:24Z
dc.date.available2010-05-06T21:57:24Z
dc.date.issued1996-10-07en_US
dc.identifier.citationHwang, Jiunn‐Ren; Lai, Richard K.; Nees, John; Norris, Ted; Whitaker, John F. (1996). "A field‐sensitive photoconductive probe for sampling through passivation layers." Applied Physics Letters 69(15): 2211-2213. <http://hdl.handle.net/2027.42/70307>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70307
dc.description.abstractA field‐sensitive photoconductive sampling technique has been demonstrated in measurements performed through an insulating layer without the need for conductive contact. Sampled signals are sensed by a virtual‐ground, floating‐gate amplifier without draining charge from the device under test or the photoconductive switch. The minimum detectable signal is 2.5 μV/Hz1/2 with a spatial resolution of 7 μm, while the sampling bandwidth is essentially that observed using photoconductive sampling with a conductive contact to the device under test. The photovoltaic and shot current noise are negligible in comparison with the lock‐in amplifier noise since the current flowing in this high‐impedance, floating‐gate probe is negligible. © 1996 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent72634 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleA field‐sensitive photoconductive probe for sampling through passivation layersen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109‐2099en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70307/2/APPLAB-69-15-2211-1.pdf
dc.identifier.doi10.1063/1.117168en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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