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Virtual phase CCD x‐ray detectors

dc.contributor.authorClarke, Royen_US
dc.contributor.authorRodricks, Brian G.en_US
dc.contributor.authorSmither, Roberten_US
dc.date.accessioned2010-05-06T22:01:48Z
dc.date.available2010-05-06T22:01:48Z
dc.date.issued1989-07en_US
dc.identifier.citationClarke, Roy; Rodricks, Brian; Smither, Robert (1989). "Virtual phase CCD x‐ray detectors." Review of Scientific Instruments 60(7): 2280-2283. <http://hdl.handle.net/2027.42/70354>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70354
dc.description.abstractA two‐dimensional charge‐coupled device (CCD) detector, based on the Texas Instruments ‘‘virtual phase’’ CCD, has been developed at the University of Michigan for synchrotron radiation applications. A series of performance tests were carried out at the LURE synchrotron facility, and the results show that the detector is ideally suited to measurements in dispersive absorption spectroscopy, high‐resolution diffuse scattering, and small‐angle scattering. The characteristics of the detector also show great promise for time‐resolved experiments.en_US
dc.format.extent3102 bytes
dc.format.extent544285 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/octet-stream
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleVirtual phase CCD x‐ray detectorsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, The University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherArgonne National Laboratory, Argonne, Illinois 60439en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70354/2/RSINAK-60-7-2280-1.pdf
dc.identifier.doi10.1063/1.1140793en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceSee paper by S. Gruner, these proceedings.en_US
dc.identifier.citedreferenceSee, “Proceedings of the Argonne Workshop on Time‐resolved Studies and Ultrafast Detectors,” Argonne, 1988. Report No. ANL∕APS‐TM‐2.en_US
dc.identifier.citedreferenceJ. Hynecek, IEEE Trans. Electron Devices ED‐28, 483 (1981).en_US
dc.identifier.citedreferenceR. D. McGrath, IEEE Trans. Nucl. Sci. NS‐28, 4028 (1981).en_US
dc.identifier.citedreferenceJ. R. Janesick, T. Elliott, H. M. Marsh, S. Collins, and J. K. McCarthy, Rev. Sci. Instrum. 56, 796 (1985).en_US
dc.identifier.citedreferenceManufactured by Texas Instruments. Note that the TI4849 is no longer available and has been superseded by another virtual phase chip, TI215.en_US
dc.identifier.citedreferenceB. Rodricks, R. Clarke, R. Smither, and A. Fontaine, Rev. Sci. Instrum. (in press).en_US
dc.identifier.citedreferenceGd2O2S:Gd2O2S: Tb (P43), manufactured by 3M Industries, St. Paul, MN.en_US
dc.identifier.citedreferenceH. W. Deckman and S. M. Gruner, Nucl. Instrum. Methods Phys. Res. A 246, 527 (1986).en_US
dc.identifier.citedreferenceG. Tourillon, E. Dartyge, A. Fontaine, and A. Jucha, Phys. Rev. Lett. 57, 603 (1986).en_US
dc.owningcollnamePhysics, Department of


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