Virtual phase CCD x‐ray detectors
dc.contributor.author | Clarke, Roy | en_US |
dc.contributor.author | Rodricks, Brian G. | en_US |
dc.contributor.author | Smither, Robert | en_US |
dc.date.accessioned | 2010-05-06T22:01:48Z | |
dc.date.available | 2010-05-06T22:01:48Z | |
dc.date.issued | 1989-07 | en_US |
dc.identifier.citation | Clarke, Roy; Rodricks, Brian; Smither, Robert (1989). "Virtual phase CCD x‐ray detectors." Review of Scientific Instruments 60(7): 2280-2283. <http://hdl.handle.net/2027.42/70354> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70354 | |
dc.description.abstract | A two‐dimensional charge‐coupled device (CCD) detector, based on the Texas Instruments ‘‘virtual phase’’ CCD, has been developed at the University of Michigan for synchrotron radiation applications. A series of performance tests were carried out at the LURE synchrotron facility, and the results show that the detector is ideally suited to measurements in dispersive absorption spectroscopy, high‐resolution diffuse scattering, and small‐angle scattering. The characteristics of the detector also show great promise for time‐resolved experiments. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 544285 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/octet-stream | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Virtual phase CCD x‐ray detectors | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Physics, The University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.contributor.affiliationother | Argonne National Laboratory, Argonne, Illinois 60439 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70354/2/RSINAK-60-7-2280-1.pdf | |
dc.identifier.doi | 10.1063/1.1140793 | en_US |
dc.identifier.source | Review of Scientific Instruments | en_US |
dc.identifier.citedreference | See paper by S. Gruner, these proceedings. | en_US |
dc.identifier.citedreference | See, “Proceedings of the Argonne Workshop on Time‐resolved Studies and Ultrafast Detectors,” Argonne, 1988. Report No. ANL∕APS‐TM‐2. | en_US |
dc.identifier.citedreference | J. Hynecek, IEEE Trans. Electron Devices ED‐28, 483 (1981). | en_US |
dc.identifier.citedreference | R. D. McGrath, IEEE Trans. Nucl. Sci. NS‐28, 4028 (1981). | en_US |
dc.identifier.citedreference | J. R. Janesick, T. Elliott, H. M. Marsh, S. Collins, and J. K. McCarthy, Rev. Sci. Instrum. 56, 796 (1985). | en_US |
dc.identifier.citedreference | Manufactured by Texas Instruments. Note that the TI4849 is no longer available and has been superseded by another virtual phase chip, TI215. | en_US |
dc.identifier.citedreference | B. Rodricks, R. Clarke, R. Smither, and A. Fontaine, Rev. Sci. Instrum. (in press). | en_US |
dc.identifier.citedreference | Gd2O2S:Gd2O2S: Tb (P43), manufactured by 3M Industries, St. Paul, MN. | en_US |
dc.identifier.citedreference | H. W. Deckman and S. M. Gruner, Nucl. Instrum. Methods Phys. Res. A 246, 527 (1986). | en_US |
dc.identifier.citedreference | G. Tourillon, E. Dartyge, A. Fontaine, and A. Jucha, Phys. Rev. Lett. 57, 603 (1986). | en_US |
dc.owningcollname | Physics, Department of |
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