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Ultraviolet light induced changes in polyimide liquid‐crystal alignment films
dc.contributor.authorLu, J.en_US
dc.contributor.authorDeshpande, Sadanand V.en_US
dc.contributor.authorGulari, Erdoganen_US
dc.contributor.authorKanicki, Jerzyen_US
dc.contributor.authorWarren, W. L.en_US
dc.date.accessioned2010-05-06T22:11:07Z
dc.date.available2010-05-06T22:11:07Z
dc.date.issued1996-11-01en_US
dc.identifier.citationLu, J.; Deshpande, S. V.; Gulari, E.; Kanicki, J.; Warren, W. L. (1996). "Ultraviolet light induced changes in polyimide liquid‐crystal alignment films." Journal of Applied Physics 80(9): 5028-5034. <http://hdl.handle.net/2027.42/70453>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70453
dc.description.abstractUltraviolet light induced changes in polyimide liquid‐crystal alignment films were investigated. Infrared, UV‐visible, x‐ray photoelectron spectroscopy, and electron‐spin‐resonance measure‐ ments indicated that bond breaking and subsequent oxidation reactions occur in polyimide films (SE7210, OCG284, DuPont 2555 and 2540) during the broadband UV illumination in air. Mechanical rubbing has no effect on the optical and magnetic properties but it causes the removal of the UV‐exposed film. Capacitance–voltage measurements indicate that there is a slight decrease in dielectric constant and creation of net negative charges in the film after UV exposure. Sur‐ face tension of polyimide films before and after UV illumination and changes in the pretilt angle of the polyimide surface following UV exposure have also been studied. The decrease in pretilt angle following UV illumination is attributed to an increase in surface tension. Our results indicate that a simple UV technique can be used to achieve domain divided liquid‐crystal pixel electrode design with improved viewing characteristics. © 1996 American Institute of Physics.en_US
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dc.format.extent159538 bytes
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleUltraviolet light induced changes in polyimide liquid‐crystal alignment filmsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Display Technology and Manufacturing, The University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherAdvanced Materials Laboratory, Sandia National Laboratories, Albuquerque, New Mexico 87185‐1349en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70453/2/JAPIAU-80-9-5028-1.pdf
dc.identifier.doi10.1063/1.363467en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.identifier.citedreferenceK. Takatori, K. Sumiyoshi, Y. Hirai, and S. Kaneko, Japan Display, 1992, p. 591.en_US
dc.identifier.citedreferenceK. H. Yang, in Record of the 1991 International Display and Research Conference, San Diego, CA (IEEE, Piscataway, NJ, 1991), p. 68.en_US
dc.identifier.citedreferenceT. Hashimoto, T. Sugiyama, K. Katoh, T. Saitoh, H. Suzuki, Y. Limura, and S. Kobayashi, in SID 1995 Digest, p. 877.en_US
dc.identifier.citedreferenceY. Koide, T. Kamada, K. Okamato, M. Ohashi, I. Tomita, and M. Okabe, SID 1992 Digest, p. 798.en_US
dc.identifier.citedreferenceY. Limura, S. Kobayashi, T. Sugiyama, Y. Toko, T. Hashimoto, and K. Kato, SID 1994 Digest, p. 915.en_US
dc.identifier.citedreferenceA. Dyaduysha, A. Khizhnyak, T. Marusii, V. Reshetnyak, Y. Reznikov, and D. Voloshchenko, Proc. SPIE 2408, 151 (1995).en_US
dc.identifier.citedreferenceS. H. Jamal, J. R. Kelly, and J. L. West, Jpn. J. Appl. Phys. 1 34, L1368 (1995).en_US
dc.identifier.citedreferenceM. Hasegawa and Y. Taira, in IRDC ‘94 Digest, 1995, p. 213.en_US
dc.identifier.citedreferenceK. P. Ghiggino, ACS Symp. Ser. 381, 27 (1989).en_US
dc.identifier.citedreferenceA. Lien, R. A. John, M. Angelopoulos, K. W. Lee, H. Takano, K. Tajima, A. Takenaka, K. Nagayama, Y. Momoi, and Y. Saitoh, Asia Display ‘95 Digest, p. 593.en_US
dc.identifier.citedreferenceJ. Lu, S. V. Deshpande, J. Kanicki, A. Lien, R. A. John, and W. L. Warren, in AMLCD ‘95 Digest, p. 97.en_US
dc.identifier.citedreferenceT. J. Sacheffer and J. Nehring, J. Appl. Phys. 48, 1783 (1977).en_US
dc.identifier.citedreferenceJ. H. O’Donnell, ACS Symp. Ser. 381, 8 (1989).en_US
dc.identifier.citedreferenceJ. C. Coburn, M. T. Pottiger, and C. A. Pryde, Mater. Res. Soc. Symp. Proc. 308, 475 (1993).en_US
dc.identifier.citedreferenceM. Dole, The Radiation Chemistry of Macromolecules (Academic, New York, 1972), Vol. 1, p. 282.en_US
dc.identifier.citedreferenceD. Campbell, Polymer characterization: Physical Techniques (Chapman and Hall, New York, 1989), Chap. 4.en_US
dc.identifier.citedreferenceY. Momose, K. Ikawa, T. Sato, and S. Okazaki, J. Appl. Polym. Sci. 33, 2715 (1987).en_US
dc.identifier.citedreferenceS. Lazare, P. D. Hoh, J. M. Baker, and R. Srinivasan, J. Am. Ceram. Soc. 106, 4288 (1984).en_US
dc.identifier.citedreferenceH. J. Leary and D. S. Campbell, ACS Symp. Ser. 162, 419 (1981).en_US
dc.identifier.citedreferenceK. Y. Han, P. Vetter, and T. Uchida, Jpn. J. Appl. Phys. 1 32, L1242 (1993).en_US
dc.identifier.citedreferenceY. Tanaka, T. Ninomiya, M. Okamoto, N. Fkuska, and H. Hatoh, in AMLCD ’95 Digest, p. 165.en_US
dc.identifier.citedreferenceT. Sasaki, M. Tsumura, Y. Nagae, M. Suzuki, and T. Iwata, Electr. Commun. Jpn. 78, 79 (1995).en_US
dc.identifier.citedreferenceJ. Cognard, Mol. Cryst. Liq. Cryst. Suppl. Series, 1, 1 (1982).en_US
dc.identifier.citedreferenceJ. G. Grabmaier, Applications of Liquid Crystals (Springer, New York, 1975), p. 100.en_US
dc.identifier.citedreferenceA. N. Seeboth, Angew. Makromol. Chem. 196, 101 (1992).en_US
dc.identifier.citedreferenceS. Wu, J. Adhes. 5, 39 (1973).en_US
dc.identifier.citedreferenceT. Abe and H. Fukuro, Org. Synth. Chem. (Jpn.) 49, 145 (1991).en_US
dc.identifier.citedreferenceK. Tsuda, H. Wakemoto, and S. Ishihara, U.S. Patent No. 5,280,375 (1994).en_US
dc.identifier.citedreferenceS. Kaneko, Y. Hirai, and K. Sumiyoshi, in SID 1993 Digest, p. 265.en_US
dc.owningcollnamePhysics, Department of


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