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An ion trap storage/time‐of‐flight mass spectrometer
dc.contributor.authorMichael, Steven M.en_US
dc.contributor.authorChien, Mingtaen_US
dc.contributor.authorLubman, David M.en_US
dc.date.accessioned2010-05-06T22:12:38Z
dc.date.available2010-05-06T22:12:38Z
dc.date.issued1992-10en_US
dc.identifier.citationMichael, Steven M.; Chien, Mingta; Lubman, David M. (1992). "An ion trap storage/time‐of‐flight mass spectrometer." Review of Scientific Instruments 63(10): 4277-4284. <http://hdl.handle.net/2027.42/70469>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70469
dc.description.abstractAn ion trap/time‐of‐flight (TOF) mass spectrometer combination has been developed in order to combine the storage capabilities of an ion trap with the speed and resolution of a time‐of‐flight device. The ion trap is an rf quadrupole trap which operates in the total storage mode, i.e., with the dc voltage=0 on the end caps and rf voltage on the ring electrode. The trap has an ion storage time of ≥2 s at an rf potential of 310 Vpp. The stored ions are ejected into the time‐of‐flight device using a −150 V dc pulse on the exit end cap which causes the ion trajectories in the trap to become unstable. The ions are mass analyzed using either a linear or reflectron TOF. In the linear mode the resolution is 240 while in the reflectron mode a resolution of 1300 at m/z 93 is achieved. The storage capabilities of this device may have important applications towards enhancing sensitivity, the study of very slow metastable decay, and photodissociation mass spectrometry and spectroscopy.en_US
dc.format.extent3102 bytes
dc.format.extent1048756 bytes
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dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleAn ion trap storage/time‐of‐flight mass spectrometeren_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, The University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70469/2/RSINAK-63-10-4277-1.pdf
dc.identifier.doi10.1063/1.1143725en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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