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Real time x‐ray studies of rapidly annealed epitaxial layers
dc.contributor.authorLowe, Walter P.en_US
dc.contributor.authorClarke, Royen_US
dc.contributor.authorDos Passos, Waldemaren_US
dc.contributor.authorRodricks, Brian G.en_US
dc.contributor.authorBrizard, Christineen_US
dc.date.accessioned2010-05-06T22:13:45Z
dc.date.available2010-05-06T22:13:45Z
dc.date.issued1992-01en_US
dc.identifier.citationLowe, Walter; Clarke, Roy; Dos Passos, Waldemar; Rodricks, Brian; Brizard, Christine (1992). "Real time x‐ray studies of rapidly annealed epitaxial layers." Review of Scientific Instruments 63(1): 704-706. <http://hdl.handle.net/2027.42/70481>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70481
dc.description.abstractTime‐resolved x‐ray scattering studies of epitaxial overlayers are presented. The results illustrate the usefulness of high‐brightness synchrotron probes for studying the cooperative kinetics of interfaces during rapid thermal processing.en_US
dc.format.extent3102 bytes
dc.format.extent406064 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleReal time x‐ray studies of rapidly annealed epitaxial layersen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherAT&T Bell Laboratories, Murray Hill, New Jersey 07974en_US
dc.contributor.affiliationotherAdvanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70481/2/RSINAK-63-1-704-1.pdf
dc.identifier.doi10.1063/1.1142642en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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