Effect of coherent strain on hydrogenic acceptor levels in InyGa1−yAs/AlxGa1−xAs quantum well structures
dc.contributor.author | Loehr, John P. | en_US |
dc.contributor.author | Chen, Y. C. | en_US |
dc.contributor.author | Biswas, Dipankar | en_US |
dc.contributor.author | Bhattacharya, Pallab K. | en_US |
dc.contributor.author | Singh, J. | en_US |
dc.date.accessioned | 2010-05-06T22:26:37Z | |
dc.date.available | 2010-05-06T22:26:37Z | |
dc.date.issued | 1990-07-09 | en_US |
dc.identifier.citation | Loehr, J. P.; Chen, Y. C.; Biswas, D.; Bhattacharya, P.; Singh, J. (1990). "Effect of coherent strain on hydrogenic acceptor levels in InyGa1−yAs/AlxGa1−xAs quantum well structures." Applied Physics Letters 57(2): 180-182. <http://hdl.handle.net/2027.42/70617> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70617 | |
dc.description.abstract | The biaxial strain produced in lattice‐mismatched epitaxy can have a substantial effect on the valence band structure. Theoretical results are presented for a hydrogenic acceptor in a quantum well under tensile and compressive strain. The acceptor level energy is a strong function of strain and could be used as a signature for the effect of strain on the valence band structure. Experimental studies are carried out on compressively strained InyGa1−yAs/ AlxGa1−xAs quantum well structures and the acceptor level energy is determined by photoluminescence measurements. Good agreement is found with the experiments. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 266242 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Effect of coherent strain on hydrogenic acceptor levels in InyGa1−yAs/AlxGa1−xAs quantum well structures | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Center for High Frequency Microelectronics, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109‐2122 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70617/2/APPLAB-57-2-180-1.pdf | |
dc.identifier.doi | 10.1063/1.103977 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
dc.identifier.citedreference | Y. C. Chang, Physica B 146, 137 (1987). | en_US |
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dc.identifier.citedreference | W. Trzeciakowski and A. P. Roth, Superlatt. Microstruct. 6, 315 (1989). | en_US |
dc.identifier.citedreference | J. M. Luttinger and W. Kohn, Phys. Rev. 97, 869 (1955). | en_US |
dc.identifier.citedreference | M. Jaffe and J. Singh, J. Appl. Phys. 65, 329 (1989). | en_US |
dc.identifier.citedreference | H. Kato, N. Iguchi, S. Chika, M. Nakayama, and N. Sano, J. Appl. Phys. 59, 588 (1986). | en_US |
dc.identifier.citedreference | J. P. Loehr and J. Singh, Phys. Rev. B 41, 3695 (1990). | en_US |
dc.owningcollname | Physics, Department of |
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