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Ion‐Migration Phenomena Observed with the Electron Microscope
dc.contributor.authorThielsch, Helmuten_US
dc.date.accessioned2010-05-06T22:31:38Z
dc.date.available2010-05-06T22:31:38Z
dc.date.issued1945-06en_US
dc.identifier.citationThielsch, Helmut (1945). "Ion‐Migration Phenomena Observed with the Electron Microscope." The Journal of Chemical Physics 13(6): 249-250. <http://hdl.handle.net/2027.42/70670>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70670
dc.format.extent3102 bytes
dc.format.extent297200 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleIon‐Migration Phenomena Observed with the Electron Microscopeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arbor, Michiganen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70670/2/JCPSA6-13-6-249-2.pdf
dc.identifier.doi10.1063/1.1724029en_US
dc.identifier.sourceThe Journal of Chemical Physicsen_US
dc.owningcollnamePhysics, Department of


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