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Refractive index and electro‐optic effect in compressive and tensile strained quantum wells

dc.contributor.authorPamulapati, Jagadeeshen_US
dc.contributor.authorLoehr, John P.en_US
dc.contributor.authorSingh, J.en_US
dc.contributor.authorBhattacharya, Pallab K.en_US
dc.contributor.authorLudowise, M. J.en_US
dc.date.accessioned2010-05-06T22:33:34Z
dc.date.available2010-05-06T22:33:34Z
dc.date.issued1991-04-01en_US
dc.identifier.citationPamulapati, J.; Loehr, J. P.; Singh, J.; Bhattacharya, P. K.; Ludowise, M. J. (1991). "Refractive index and electro‐optic effect in compressive and tensile strained quantum wells." Journal of Applied Physics 69(7): 4071-4074. <http://hdl.handle.net/2027.42/70690>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70690
dc.description.abstractThe effects of biaxial compressive and tensile strain on the excitonic resonances and associated changes in refractive index and electro‐optic effect in quantum wells have been calculated and measured. Theoretical calculations include the important heavy‐hole–light–hole band mixing effects. It is seen that the excitonic contributions dominate near the band edge. With increasing compressive strain the linear electro‐optic effect is slightly increased, while the quadratic effect is greatly enhanced. The effects are reversed in quantum wells under tensile strain.en_US
dc.format.extent3102 bytes
dc.format.extent425921 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleRefractive index and electro‐optic effect in compressive and tensile strained quantum wellsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for High‐Frequency Microelectronics, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109‐2122en_US
dc.contributor.affiliationotherHewlett‐Packard Laboratories, 3500 Deer Creek Road, Palo Alto, California 94304en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70690/2/JAPIAU-69-7-4071-1.pdf
dc.identifier.doi10.1063/1.348418en_US
dc.identifier.sourceJournal of Applied Physicsen_US
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dc.owningcollnamePhysics, Department of


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