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A fiber‐mounted, micromachined photoconductive probe with 15 nV/Hz1/2 sensitivity
dc.contributor.authorLai, Richard K.en_US
dc.contributor.authorHwang, Jiunn‐Renen_US
dc.contributor.authorNees, John A.en_US
dc.contributor.authorNorris, Theodore B.en_US
dc.contributor.authorWhitaker, John F.en_US
dc.date.accessioned2010-05-06T22:41:58Z
dc.date.available2010-05-06T22:41:58Z
dc.date.issued1996-09-23en_US
dc.identifier.citationLai, Richard K.; Hwang, Jiunn‐Ren; Nees, John; Norris, Theodore B.; Whitaker, John F. (1996). "A fiber‐mounted, micromachined photoconductive probe with 15 nV/Hz1/2 sensitivity." Applied Physics Letters 69(13): 1843-1845. <http://hdl.handle.net/2027.42/70779>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70779
dc.description.abstractWe report the performance of a micromachined, photoconductive‐sampling probe that is fabricated on low‐temperature‐grown GaAs and mounted on a single‐mode optical fiber. The epitaxial probe has a temporal resolution of 3.5 ps, a spatial resolution of 7 μm, and a sensitivity of 15 nV/(Hz)1/2 when integrated with a high impedance, junction field‐effect transistor source follower. The fiber, which couples short laser pulses to the interdigitated detector pattern on the probe, also provides flexible support and mobility. The probe’s compact cross section makes it ideal for applications as an internal‐node, picosecond‐response, photoconductive sampling probe or wave form launcher for test and characterization of integrated circuits. © 1996 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent112854 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleA fiber‐mounted, micromachined photoconductive probe with 15 nV/Hz1/2 sensitivityen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109‐2099en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70779/2/APPLAB-69-13-1843-1.pdf
dc.identifier.doi10.1063/1.117452en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceD. H. Auston, in Measurement of High-Speed Signals in Solid State Devices, edited by R. B. Marcus (Academic, San Diego, 1990), Chap. 3, p. 85.en_US
dc.identifier.citedreferenceC. H. Lee, IEEE Trans. Microwave Theory Tech. IETMABINS38, 596(1990).en_US
dc.identifier.citedreferenceM. Matloubian, H. Fetterman, M. Kim, A. Oki, J. Camou, S. Moss, and D. Smith, IEEE Trans. Microwave Theory Tech. IETMABINS38, 683(1990).en_US
dc.identifier.citedreferenceJ. Kim, S. Williamson, J. Nees, S. Wakana, and J. Whitaker, Appl. Phys. Lett. APPLABAIP62, 2268(1993).en_US
dc.identifier.citedreferenceT. Pfeifer, H.-M. Heiliger, E. Stein von Kamienski, H. G. Roskos, and H. Kurz, J. Opt. Soc. Am. B JOBPDEAIP11, 2547(1994).en_US
dc.identifier.citedreferenceM. Scheuermann, R. Sprik, J.-M. Halbout, P. A. Moskowitz, and M. Ketchen, in OSA Proceedings on Picosecond Electronics and Optoelectronics, edited by T. C. L. G. Sollner and D. M. Bloom (Optical Society of America, Washington, D.C., 1989), Vol. 4, p. 22.en_US
dc.identifier.citedreferenceM. D. Feuer, S. C. Shunk, P. R. Smith, M. C. Nuss, and H. H. Law, IEEE Photonics Technol. Lett. IPTLELINS5, 361(1993).en_US
dc.identifier.citedreferenceD. H. Auston, in Ultrashort Laser Pulses: Generation and Applications, 2nd ed., edited by W. Kaiser (Springer, New York, 1993), p. 203.en_US
dc.identifier.citedreferenceJ. R. Hwang, H. J. Chang, J. F. Whitaker, and J. V. Rudd, Opt. Quantum Electron. OQELDI28, 961(1996).en_US
dc.identifier.citedreferenceJ. Nees, S. Wakana, and S. Hama, Opt. Quantum Electron. OQELDI28, 843(1996).en_US
dc.identifier.citedreferenceJ. R. Hwang, H. J. Cheng, J. F. Whitaker, and J. V. Rudd, Appl. Phys. Lett. APPLABAIP68, 1464(1996).en_US
dc.owningcollnamePhysics, Department of


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