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Semiconductor detector for the selective detection of atomic hydrogen
dc.contributor.authorHarvey, K. C.en_US
dc.contributor.authorFehrenbach, C.en_US
dc.date.accessioned2010-05-06T22:42:26Z
dc.date.available2010-05-06T22:42:26Z
dc.date.issued1983-09en_US
dc.identifier.citationHarvey, K. C.; Fehrenbach, C. (1983). "Semiconductor detector for the selective detection of atomic hydrogen." Review of Scientific Instruments 54(9): 1117-1120. <http://hdl.handle.net/2027.42/70784>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70784
dc.description.abstractA semiconductor detector is described which responds to the atomic hydrogen in an atomic beam but is insensitive to molecular hydrogen. The hydrogen flux is measured through the change in conductivity of the semiconductor material which occurs when the hydrogen is chemisorbed. The atomic flux from a rf hydrogen discharge is used to determine the sensitivity of the detector. The minimum detectable signal is ∼109 hydrogen atoms mm−2 s−1. The detector has a response time of less than 2 ms.en_US
dc.format.extent3102 bytes
dc.format.extent378339 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleSemiconductor detector for the selective detection of atomic hydrogenen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumHarrison M. Randall Laboratory, The University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70784/2/RSINAK-54-9-1117-1.pdf
dc.identifier.doi10.1063/1.1137526en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.identifier.citedreferenceThermometrics, Edison, New Jersey 08817. A Thermoflake with a 1×1‐mm1×1‐mm cross section and a resistance of 1 MΩ1MΩ was used for most of this work.en_US
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dc.owningcollnamePhysics, Department of


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