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Effect of Electromagnetic Propagation on the Magnetostatic Modes

dc.contributor.authorRibbens, William B.en_US
dc.date.accessioned2010-05-06T22:44:09Z
dc.date.available2010-05-06T22:44:09Z
dc.date.issued1963-09en_US
dc.identifier.citationRibbens, W. B. (1963). "Effect of Electromagnetic Propagation on the Magnetostatic Modes." Journal of Applied Physics 34(9): 2639-2645. <http://hdl.handle.net/2027.42/70802>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70802
dc.description.abstractThe second‐order effect of electromagnetic propagation on the essentially static‐field distribution of the magnetostatic modes of a ferromagnetic sample is obtained by an iteration‐type technique. The magnetostatic potential constitutes the source in a mathematical sense for a second‐order correct field distribution. The internal sample fields are investigated for a ferrite cylinder enclosed between parallel conducting plates and they are found to consist of resonant modes whose frequencies are determined from a characteristic equation. These frequencies reduce to those of the magnetostatic modes in the limit of vanishingly small wavenumbers. For a nonzero wavenumber the frequencies differ from the corresponding magnetostatic limits by an amount which depends on the sample shape. These resonant frequencies are size‐dependent as contrasted to the size‐independent magnetostatic modes. No resonant frequencies are possible above a critical value that depends on the spacing between the plates. A sample mode, whose resonant frequency is in a region forbidden to the magnetostatic modes, can exist if the sample size exceeds a critical value.en_US
dc.format.extent3102 bytes
dc.format.extent539077 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleEffect of Electromagnetic Propagation on the Magnetostatic Modesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCooley Electronics Laboratory, The University of Michigan, Ann Arbor, Michiganen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70802/2/JAPIAU-34-9-2639-1.pdf
dc.identifier.doi10.1063/1.1729784en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.identifier.citedreferenceL. R. Walker, Phys. Rev. 105, 390 (1957).en_US
dc.identifier.citedreferenceW. B. Ribbens, Proc. IEEE 51, 394 (1963).en_US
dc.identifier.citedreferenceL. R. White and I. H. Solt, Phys. Rev. 104, 56 (1956).en_US
dc.identifier.citedreferenceR. I. Joseph and E. Schlömann, J. Appl. Phys. 32, 1001 (1961).en_US
dc.owningcollnamePhysics, Department of


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