Transfer matrix method for interface optical-phonon modes in multiple-interface heterostructure systems
dc.contributor.author | Yu, SeGi | en_US |
dc.contributor.author | Kim, K. W. | en_US |
dc.contributor.author | Stroscio, Michael A. | en_US |
dc.contributor.author | Iafrate, G. J. | en_US |
dc.contributor.author | Sun, J. P. | en_US |
dc.contributor.author | Haddad, George I. | en_US |
dc.date.accessioned | 2010-05-06T22:49:55Z | |
dc.date.available | 2010-05-06T22:49:55Z | |
dc.date.issued | 1997-10-01 | en_US |
dc.identifier.citation | Yu, SeGi; Kim, K. W.; Stroscio, Michael A.; Iafrate, G. J.; Sun, J.-P.; Haddad, G. I. (1997). "Transfer matrix method for interface optical-phonon modes in multiple-interface heterostructure systems." Journal of Applied Physics 82(7): 3363-3367. <http://hdl.handle.net/2027.42/70863> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70863 | |
dc.description.abstract | Interactions of carriers with interface optical phonons dominate over other carrier–phonon scatterings in narrow quantum-well structures. Herein, a transfer matrix method is used to establish a formalism for determining the dispersion relations, electrostatic potentials, and Fröhlich interaction Hamiltonians of the interface optical phonons for multiple-interface heterostructure systems within the framework of the macroscopic dielectric continuum model. This method facilitates systematic calculations for complex structures where the conventional method is very difficult to implement. Several specific cases are treated to illustrate the advantages of the general formalism. © 1997 American Institute of Physics. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 145005 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Transfer matrix method for interface optical-phonon modes in multiple-interface heterostructure systems | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122 | en_US |
dc.contributor.affiliationother | Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, North Carolina 27695-7911 | en_US |
dc.contributor.affiliationother | U. S. Army Research Office, P. O. Box 12211, Research Triangle Park, North Carolina 27709-2211 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70863/2/JAPIAU-82-7-3363-1.pdf | |
dc.identifier.doi | 10.1063/1.365649 | en_US |
dc.identifier.source | Journal of Applied Physics | en_US |
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dc.owningcollname | Physics, Department of |
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