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Electron diffraction studies of supersonic jets. I. Apparatus and methods
dc.contributor.authorBartell, Lawrence S.en_US
dc.contributor.authorHeenan, Richard K.en_US
dc.contributor.authorNagashima, Makotoen_US
dc.date.accessioned2010-05-06T22:52:24Z
dc.date.available2010-05-06T22:52:24Z
dc.date.issued1983-01-01en_US
dc.identifier.citationBartell, Lawrence S.; Heenan, Richard K.; Nagashima, Makoto (1983). "Electron diffraction studies of supersonic jets. I. Apparatus and methods." The Journal of Chemical Physics 78(1): 236-242. <http://hdl.handle.net/2027.42/70889>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70889
dc.description.abstractWe describe the apparatus and methods used to obtain electron diffraction patterns of low‐temperature species produced from molecules seeded into supersonic expansions of helium or neon carrier gases. Although systems designed for molecular beam or spectroscopic studies are unsuitable for electron diffraction, alternative arrangements were found that give diffraction patterns of good quality. Characteristics of gas jets issuing from different nozzle designs are discussed. Procedures are outlined for separating the desired signal from considerable background scattering by the carrier gas and to correct for broad gas density profiles in analyses of diffraction data.en_US
dc.format.extent3102 bytes
dc.format.extent575835 bytes
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dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleElectron diffraction studies of supersonic jets. I. Apparatus and methodsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70889/2/JCPSA6-78-1-236-1.pdf
dc.identifier.doi10.1063/1.444546en_US
dc.identifier.sourceThe Journal of Chemical Physicsen_US
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dc.identifier.citedreferenceWe are grateful to Metex Corporation, New Jersey, for a sample of their CS‐67 material.en_US
dc.identifier.citedreferenceO. Abraham, J. H. Binn, B. G. DeBoer, and G. D. Stein, Phys. Fluids 24, 1017 (1981); O. Abraham, S. S. Kim, and G. D. Stein, J. Chem. Phys. 75, 402 (1981).en_US
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dc.identifier.citedreferenceE. J. Valente, R. K. Heenan, and L. S. Bartell (unpublished research).en_US
dc.identifier.citedreferenceO. F. Hagena and H. von Wedel, Rarefied Gas Dynamics, Ninth Symposium, edited by M. Becker and M. Fiebig (DFVLR, Porz‐Wahn, Germany, 1974); O. F. Hagena and W. Obert, J. Chem. Phys. 56, 1793 (1972).en_US
dc.owningcollnamePhysics, Department of


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