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Determination of Object Thickness in Electron Microscopy
dc.contributor.authorMarton, L.en_US
dc.contributor.authorSchiff, L. I.en_US
dc.date.accessioned2010-05-06T22:55:07Z
dc.date.available2010-05-06T22:55:07Z
dc.date.issued1941-10en_US
dc.identifier.citationMarton, L.; Schiff, L. I. (1941). "Determination of Object Thickness in Electron Microscopy." Journal of Applied Physics 12(10): 759-765. <http://hdl.handle.net/2027.42/70918>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70918
dc.description.abstractIt is proposed that the thicknesses of electron microscope objects be determined by measuring the diminution in intensity of the electron beam caused by the object. Since this method would only be applied to specimens so thin that multiple scattering can be neglected, one need know only the total cross section for single scattering of electrons outside the aperture angle of the electron microscope objective. These cross sections are calculated for fast electrons (energies greater than 10,000 ev) by means of the Born approximation for several cases of practical interest, and the results are applied to some experimental observations.en_US
dc.format.extent3102 bytes
dc.format.extent1079579 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleDetermination of Object Thickness in Electron Microscopyen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumThe Harrison M. Randall Laboratory of Physics, University of Michigan, Ann Arbor, Michiganen_US
dc.contributor.affiliationotherRandal Morgan Laboratory of Physics, University of Pennsylvania, Philadelphia, Pennsylvaniaen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70918/2/JAPIAU-12-10-759-1.pdf
dc.identifier.doi10.1063/1.1712863en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.identifier.citedreferenceSee T. H. Osgood, J. App. Phys. 12, 96 (1941).en_US
dc.identifier.citedreferenceThis micrograph was taken by keeping the object stationary and changing the angle of incidence of the condenser beam, instead of the usual method of tilting the specimen. This could be done because of the relatively large apertures of the electron microscope used for taking these pictures (see also L. Marton, Phys. Rev. 58, 57 (1940)) and because the image quality is primarily defined by the solid angle of the incident (condenser) beam and not by the actual size of the objective aperture (due to the predominance of large angles in the scattered beam). (See also V. Borries and Ruska, Zeits. f. Tech. Physik 19, 404 (1938).) For stereophotogrammetric measurements see W. Eitel and E. Gotthardt, Naturwiss. 28, 367 (1940); smallest measured thickness 200A, accuracy ±50A.±50A.en_US
dc.identifier.citedreferenceIn contrast to a former paper where an estimation of “depth resolving power” was given by considering multiple scattering alone [L. Marton, Physica 9, 959 (1936)].en_US
dc.identifier.citedreferenceF. Seitz, Modern Theory of Solids (McGraw‐Hill, 1940), p. 72.en_US
dc.identifier.citedreferenceN. F. Mott and H. S. W. Massey, Theory of Atomic Collisions (Oxford, 1933), p. 88.en_US
dc.identifier.citedreferenceReference 5, p. 124.en_US
dc.identifier.citedreferenceReference 5, Chapter XI, especially Eqs. (39), (38), (13), (7). The relativity modifications can be established by the method of impact parameters: E. J. Williams, Proc. Roy. Soc. A139, 163 (1933).en_US
dc.identifier.citedreferenceJ. C. Slater, Phys. Rev. 36, 57 (1930).en_US
dc.identifier.citedreferenceG. W. Brindley, Phil. Mag. 11, 786 (1931); F. E. Hoare, Proc. Roy. Soc. A147, 88 (1934).en_US
dc.identifier.citedreferenceJ. B. H. Kuper, Phys. Rev. 53, 993 (1938).en_US
dc.identifier.citedreferenceJ. B. H. Kuper and E. Teller, Phys. Rev. 58, 602 (1940).en_US
dc.identifier.citedreferenceSee also reference 5, p. 270.en_US
dc.identifier.citedreferenceE. J. Williams, Proc. Roy. Soc. A169, 531 (1939),en_US
dc.identifier.citedreferenceS. Goudsmit and J. L. Saunderson, Phys. Rev. 58, 36 (1940).en_US
dc.identifier.citedreferenceSee, for instance, E. Perucca, Nuovo Cimento 15, 365 (1938); J. Strong and B. Dibble, J. Opt Soc. Am. 30, 431 (1940).en_US
dc.identifier.citedreferenceL. Marton, J. W. McBain and R. D. Vold, J. Am. Chem. Soc. 63, 1990 (1941).en_US
dc.identifier.citedreferencePrepared by Dr. E. G. Ramberg.en_US
dc.owningcollnamePhysics, Department of


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