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Imaging nanostructures with coherent phonon pulses
dc.contributor.authorDaly, B. C.en_US
dc.contributor.authorHolme, N. C. R.en_US
dc.contributor.authorBuma, Takashien_US
dc.contributor.authorBranciard, C.en_US
dc.contributor.authorNorris, Theodore B.en_US
dc.contributor.authorTennant, D. M.en_US
dc.contributor.authorTaylor, J. A.en_US
dc.contributor.authorBower, J. E.en_US
dc.contributor.authorPau, S.en_US
dc.date.accessioned2010-05-06T23:16:41Z
dc.date.available2010-05-06T23:16:41Z
dc.date.issued2004-06-21en_US
dc.identifier.citationDaly, B. C.; Holme, N. C. R.; Buma, T.; Branciard, C.; Norris, T. B.; Tennant, D. M.; Taylor, J. A.; Bower, J. E.; Pau, S. (2004). "Imaging nanostructures with coherent phonon pulses." Applied Physics Letters 84(25): 5180-5182. <http://hdl.handle.net/2027.42/71146>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/71146
dc.description.abstractWe demonstrate submicron resolution imaging using picosecond acoustic phonon pulses. High-frequency acoustic pulses are generated by impulsive thermoelastic excitation of a patterned 15-nm15-nm-thick metal film on a crystalline substrate using ultrafast optical pulses. The spatiotemporal diffracted acoustic strain field is measured on the opposite side of the substrate, and this field is used in a time-reversal algorithm to reconstruct the object. The image resolution is characterized using lithographically defined 1-micron1-micron-period Al structures on Si. Straightforward technical improvements should lead to resolution approaching 45 nm45nm, extending the resolution of acoustic microscopy into the nanoscale regime.en_US
dc.format.extent3102 bytes
dc.format.extent222743 bytes
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dc.format.mimetypeapplication/octet-stream
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleImaging nanostructures with coherent phonon pulsesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science and EECS Department, University of Michigan, Ann Arbor, Michigan 48109-2099en_US
dc.contributor.affiliationotherBell Laboratories, Lucent Technologies Murray Hill, New Jersey 07974en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/71146/2/APPLAB-84-25-5180-1.pdf
dc.identifier.doi10.1063/1.1764599en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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