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Multipactor experiment on a dielectric surface

dc.contributor.authorAnderson, R. B.en_US
dc.contributor.authorGetty, W. D.en_US
dc.contributor.authorBrake, Mary L.en_US
dc.contributor.authorLau, Y. Y.en_US
dc.contributor.authorGilgenbach, Ronald M.en_US
dc.contributor.authorValfells, Agusten_US
dc.date.accessioned2010-05-06T23:20:14Z
dc.date.available2010-05-06T23:20:14Z
dc.date.issued2001-07en_US
dc.identifier.citationAnderson, R. B.; Getty, W. D.; Brake, M. L.; Lau, Y. Y.; Gilgenbach, R. M.; Valfells, A. (2001). "Multipactor experiment on a dielectric surface." Review of Scientific Instruments 72(7): 3095-3099. <http://hdl.handle.net/2027.42/71183>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/71183
dc.description.abstractA novel experiment to investigate single-surface multipactor on a dielectric surface was developed and tested. The compact apparatus consists of a small brass microwave cavity in a high vacuum system. The cavity is ∼15 cm in length with an outer diameter of ∼10 cm. A pulsed variable frequency microwave source at ∼2.4 GHz, 2 kW peak excites the TE111TE111 mode with a strong electric field parallel to a dielectric plate (∼0.2 cm thickness) that is inserted at midlength of the cavity. The microwave pulses are monitored by calibrated microwave diodes. An electron probe measures electron current and provides temporal measurements of the multipactor electron current with respect to the microwave pulses. Phosphor on the dielectric surface is used to detect multipactor electrons by photoemission. The motivation of this experiment is to test recent theoretical calculations of single-surface multipactor on a dielectric. © 2001 American Institute of Physics.en_US
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dc.format.extent335238 bytes
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dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleMultipactor experiment on a dielectric surfaceen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2104en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/71183/2/RSINAK-72-7-3095-1.pdf
dc.identifier.doi10.1063/1.1380687en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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