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Effect of spectral broadening and electron‐hole scattering on carrier relaxation in GaAs quantum dots

dc.contributor.authorVurgaftman, Igoren_US
dc.contributor.authorSingh, Jaspriten_US
dc.date.accessioned2010-05-06T23:22:54Z
dc.date.available2010-05-06T23:22:54Z
dc.date.issued1994-01-10en_US
dc.identifier.citationVurgaftman, Igor; Singh, Jasprit (1994). "Effect of spectral broadening and electron‐hole scattering on carrier relaxation in GaAs quantum dots." Applied Physics Letters 64(2): 232-234. <http://hdl.handle.net/2027.42/71211>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/71211
dc.description.abstractLuminescence efficiency in quantum dots has been a matter of some controversy recently. Theoretically, poor efficiency has been predicted owing to the phonon bottleneck in carrier relaxation, while slightly enhanced luminescence has been reported in several experiments. The approach of this letter differs from previous theoretical work in that the scattering rates are computed self‐consistently accounting for the spectral broadening of the electronic spectra due to a finite energy level lifetime. Scattering of electrons and holes confined in the dot is found to be responsible for breaking the phonon bottleneck in electron relaxation reducing the relaxation time from several ns to several hundred ps. Results of a Monte Carlo simulation also including confined and interface polar optical phonon and acoustic phonon scattering for a range of quantum dot dimensions and temperatures are presented. These results may provide an explanation of the absence of a significant reduction in quantum dot luminescence compared with that from quantum wells.en_US
dc.format.extent3102 bytes
dc.format.extent422487 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleEffect of spectral broadening and electron‐hole scattering on carrier relaxation in GaAs quantum dotsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109‐2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/71211/2/APPLAB-64-2-232-1.pdf
dc.identifier.doi10.1063/1.111513en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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