Design for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization source
dc.contributor.author | Lubman, David M. | en_US |
dc.contributor.author | Jordan, Russ M. | en_US |
dc.date.accessioned | 2010-05-06T23:31:33Z | |
dc.date.available | 2010-05-06T23:31:33Z | |
dc.date.issued | 1985-03 | en_US |
dc.identifier.citation | Lubman, David M.; Jordan, Russ M. (1985). "Design for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization source." Review of Scientific Instruments 56(3): 373-376. <http://hdl.handle.net/2027.42/71301> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/71301 | |
dc.description.abstract | This article describes the design of a time‐of‐flight mass spectrometer (TOFMS) constructed for optimum use with resonance‐enhanced multiphoton ionization spectroscopy in supersonic beams. The use of the supersonic beam results in a great improvement in resolution, i.e., at least 800 at mass 93. Ion packets on the order of 10 ns FWHM or less are observed at our flat dual channel plate detector and the resolution ultimately appears to be laser‐pulse‐width limited. The design of this TOFMS utilizes fast‐pulsed molecular beam techniques to allow the use of reservoir pressures >1 atm with a large orifice (0.5 mm) in order to provide high on‐axis intensity for maximizing the photoionization signal produced by our pulsed laser system with the use of only modest pumping capacity. It also uses a skimmed beam, differential pumping, and a liquid‐N2 baffle in order to maintain the flight tube at pressures on the order of 5×10−7 Torr and to eliminate organic contamination from the ionization region. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 401211 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/octet-stream | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Design for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization source | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | The University of Michigan, Department of Chemistry, Ann Arbor, Michigan 48109 | en_US |
dc.contributor.affiliationother | R. M. Jordan Co., 2541 Leghorn Street, Mountain View, California 94043 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/71301/2/RSINAK-56-3-373-1.pdf | |
dc.identifier.doi | 10.1063/1.1138306 | en_US |
dc.identifier.source | Review of Scientific Instruments | en_US |
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dc.identifier.citedreference | T. G. Dietz, M. A. Duncan, M. G. Liverman, and R. E. Smalley, J. Chem. Phys. 73, 4816 (1980) and references cited therein. | en_US |
dc.identifier.citedreference | R. E. Smalley, L. Wharton, and D. H. Levy, Acc. Chem. Res. 10, 139 (1977). | en_US |
dc.identifier.citedreference | J. B. Anderson, R. P. Andres, and J. B. Fenn, Adv. Chem. Phys. 10, 275 (1966). | en_US |
dc.identifier.citedreference | W. R. Gentry and C. R. Giese, Rev. Sci. Instrum. 49, 595 (1978). | en_US |
dc.identifier.citedreference | R. L. Byer and M. D. Duncan, J. Chem. Phys. 74, 2174 (1981). | en_US |
dc.identifier.citedreference | R. J. Rorden and D. M. Lubman, Rev. Sci. Instrum. 54, 641 (1983). | en_US |
dc.owningcollname | Physics, Department of |
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