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Design for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization source

dc.contributor.authorLubman, David M.en_US
dc.contributor.authorJordan, Russ M.en_US
dc.date.accessioned2010-05-06T23:31:33Z
dc.date.available2010-05-06T23:31:33Z
dc.date.issued1985-03en_US
dc.identifier.citationLubman, David M.; Jordan, Russ M. (1985). "Design for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization source." Review of Scientific Instruments 56(3): 373-376. <http://hdl.handle.net/2027.42/71301>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/71301
dc.description.abstractThis article describes the design of a time‐of‐flight mass spectrometer (TOFMS) constructed for optimum use with resonance‐enhanced multiphoton ionization spectroscopy in supersonic beams. The use of the supersonic beam results in a great improvement in resolution, i.e., at least 800 at mass 93. Ion packets on the order of 10 ns FWHM or less are observed at our flat dual channel plate detector and the resolution ultimately appears to be laser‐pulse‐width limited. The design of this TOFMS utilizes fast‐pulsed molecular beam techniques to allow the use of reservoir pressures >1 atm with a large orifice (0.5 mm) in order to provide high on‐axis intensity for maximizing the photoionization signal produced by our pulsed laser system with the use of only modest pumping capacity. It also uses a skimmed beam, differential pumping, and a liquid‐N2 baffle in order to maintain the flight tube at pressures on the order of 5×10−7 Torr and to eliminate organic contamination from the ionization region.en_US
dc.format.extent3102 bytes
dc.format.extent401211 bytes
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dc.format.mimetypeapplication/octet-stream
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleDesign for improved resolution in a time‐of‐flight mass spectrometer using a supersonic beam and laser ionization sourceen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumThe University of Michigan, Department of Chemistry, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherR. M. Jordan Co., 2541 Leghorn Street, Mountain View, California 94043en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/71301/2/RSINAK-56-3-373-1.pdf
dc.identifier.doi10.1063/1.1138306en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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