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[EMV-5] : analysis of the tehcniques [sic] employed in EMV 2, EMV 3, EMV 4, and also a study of the precision of the photographic techniques employed
dc.contributor.authorSiegel, Keeve Miltonen_US
dc.contributor.authorCooper, J. B.en_US
dc.date.accessioned2006-02-03T18:07:06Z
dc.date.available2006-02-03T18:07:06Z
dc.date.issued1948en_US
dc.identifierUMR3725en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/7621
dc.format.extent11 bytes
dc.format.extent13987 bytes
dc.format.extent3366 bytes
dc.format.extent16306 bytes
dc.format.extent1085945 bytes
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen_US
dc.subjectGas flow.en_US
dc.subjectAerodynamics.en_US
dc.subjectApplied photography.en_US
dc.title[EMV-5] : analysis of the tehcniques [sic] employed in EMV 2, EMV 3, EMV 4, and also a study of the precision of the photographic techniques employeden_US
dc.title.alternativeAnalysis of the techniques employed in EMV 2, EMV 3, EMV 4, and also a study of the precision of the photographic techniques employed.en_US
dc.typeTechnical Reporten_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7621/5/bad2252.0001.001.pdfen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7621/4/bad2252.0001.001.txten_US
dc.owningcollnameEngineering, College of - Technical Reports


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