Hot carrier cooling by acoustic phonons in epitaxial graphene by ultrafast pump-probe spectroscopy
dc.contributor.author | Sun, Dong | en_US |
dc.contributor.author | Divin, Charles John | en_US |
dc.contributor.author | Berger, Claire | en_US |
dc.contributor.author | de Heer, Walt A. | en_US |
dc.contributor.author | First, Phillip N. | en_US |
dc.contributor.author | Norris, Theodore B. | en_US |
dc.date.accessioned | 2011-04-07T18:52:10Z | |
dc.date.accessioned | 2011-04-07T18:52:10Z | |
dc.date.available | 2012-05-14T20:40:08Z | en_US |
dc.date.issued | 2011-04 | en_US |
dc.identifier.citation | Sun, Dong; Divin, Charles; Berger, Claire; de Heer, Walt A.; First, Phillip N.; Norris, Theodore B. (2011). "Hot carrier cooling by acoustic phonons in epitaxial graphene by ultrafast pump-probe spectroscopy." physica status solidi c 8(4): 1194-1197. <http://hdl.handle.net/2027.42/83459> | en_US |
dc.identifier.issn | 1862-6351 | en_US |
dc.identifier.issn | 1610-1642 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/83459 | |
dc.description.abstract | We report the application nondegenerate ultrafast mid-infrared spectroscopy to investigate the acoustic phonon cooling process in epitaxial graphene. We show that the power-dependent experimental results match theoretical predictions of the low temperature acoustic cooling process. The hot phonon effect in acoustic phonon cooling is observed experimentally, and a deformation potential of 30 eV can be determined from fitting the data. (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) | en_US |
dc.publisher | WILEY-VCH Verlag | en_US |
dc.subject.other | Physics | en_US |
dc.title | Hot carrier cooling by acoustic phonons in epitaxial graphene by ultrafast pump-probe spectroscopy | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Electrical Engineering and Computer Science | en_US |
dc.subject.hlbsecondlevel | Materials Science and Engineering | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109 Ann Arbor, USA | en_US |
dc.contributor.affiliationum | Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109 Ann Arbor, USA | en_US |
dc.contributor.affiliationum | Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109 Ann Arbor, USA ; Phone: +001 734 764 9269, Fax: +001 734 763 4876 | en_US |
dc.contributor.affiliationother | School of Physics, Georgia Institute of Technology, 30332 Atlanta, USA | en_US |
dc.contributor.affiliationother | School of Physics, Georgia Institute of Technology, 30332 Atlanta, USA | en_US |
dc.contributor.affiliationother | School of Physics, Georgia Institute of Technology, 30332 Atlanta, USA | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/83459/1/1194_ftp.pdf | |
dc.identifier.doi | 10.1002/pssc.201001134 | en_US |
dc.identifier.source | physica status solidi c | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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