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Large displacement vertical translational actuator based on piezoelectric thin films

dc.contributor.authorQiu, Zhenen_US
dc.contributor.authorPulskamp, Jeffrey S.en_US
dc.contributor.authorLin, Xiankeen_US
dc.contributor.authorRhee, Choong-Hoen_US
dc.contributor.authorWang, Thomasen_US
dc.contributor.authorPolcawich, Ronald G.en_US
dc.contributor.authorOldham, Kennen_US
dc.date.accessioned2011-08-10T13:53:02Z
dc.date.available2011-08-10T13:53:02Z
dc.date.issued2010-07en_US
dc.identifier.citationQiu, Zhen; Pulskamp, Jeffrey S.; Lin, Xianke; Rhee, Choong-Ho; Wang, Thomas; Polcawich, Ronald G.; Oldham, Kenn (2010). "Large displacement vertical translational actuator based on piezoelectric thin films." Journal of Micromechanics and Microengineering, 20(7): 075016. <http://hdl.handle.net/2027.42/85407>en_US
dc.identifier.issn0960-1317en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85407
dc.description.abstractA novel vertical translational microactuator based on thin-film piezoelectric actuation is presented, using a set of four compound bend-up/bend-down unimorphs to produce translational motion of a moving platform or stage. The actuation material is a chemical-solution deposited lead–zirconate–titanate (PZT) thin film. Prototype designs have shown as much as 120 µm of static displacement, with 80–90 µm displacements being typical, using four 920 µm long by 70 µm legs. Analytical models are presented that accurately describe nonlinear behavior in both static and dynamic operation of prototype stages when the dependence of piezoelectric coefficients on voltage is known. Resonance of the system is observed at a frequency of 200 Hz. The large displacement and high bandwidth of the actuators at low-voltage and low-power levels should make them useful to a variety of optical applications, including endoscopic microscopy.en_US
dc.titleLarge displacement vertical translational actuator based on piezoelectric thin filmsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85407/1/jmm10_7_075016.pdf
dc.identifier.doi10.1088/0960-1317/20/7/075016en_US
dc.identifier.sourceJournal of Micromechanics and Microengineeringen_US
dc.owningcollnamePhysics, Department of


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