Show simple item record

Mean and Variance of Implicitly Defined Biased Estimators (Such as Penalized Maximum Likelihood) : Applications to Tomography

dc.contributor.authorFessler, Jeffrey A.en_US
dc.date.accessioned2011-08-18T18:20:48Z
dc.date.available2011-08-18T18:20:48Z
dc.date.issued1996-03en_US
dc.identifier.citationFessler, Jeffrey A. (1996). "Mean and Variance of Implicitly Defined Biased Estimators (Such as Penalized Maximum Likelihood) : Applications to Tomography". IEEE Transactions on Image Processing 5(3): 493-506. <http://hdl.handle.net/2027.42/85819>en_US
dc.identifier.issn1057-7149en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85819
dc.description.abstractMany estimators in signal processing problems are defined implicitly as the maximum of some objective function. Examples of implicitly defined estimators include maximum likelihood, penalized likelihood, maximum a posteriori, and nonlinear least squares estimation. For such estimators, exact analytical expressions for the mean and variance are usually unavailable. Therefore, investigators usually resort to numerical simulations to examine the properties of the mean and variance of such estimators. This paper describes approximate expressions for the mean and variance of implicitly defined estimators of unconstrained continuous parameters. We derive the approximations using the implicit function theorem, the Taylor expansion, and the chain rule. The expressions are defined solely in terms of the partial derivatives of whatever objective function one uses for estimation. As illustrations, we demonstrate that the approximations work well in two tomographic imaging applications with Poisson statistics. We also describe a “plug-in” approximation that provides a remarkably accurate estimate of variability even from a single noisy Poisson sinogram measurement. The approximations should be useful in a wide range of estimation problems.en_US
dc.publisherIEEEen_US
dc.titleMean and Variance of Implicitly Defined Biased Estimators (Such as Penalized Maximum Likelihood) : Applications to Tomographyen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.identifier.pmid18285134en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85819/1/Fessler99.pdf
dc.identifier.doi10.1109/83.491322en_US
dc.identifier.sourceIEEE Transactions on Image Processingen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.