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Statistical Sinogram Restoration in Dual-Energy CT for PET Attenuation Correction

dc.contributor.authorNoh, Joonkien_US
dc.contributor.authorFessler, Jeffrey A.en_US
dc.contributor.authorKinahan, Paul E.en_US
dc.contributor.authoren_US
dc.date.accessioned2011-08-18T18:21:02Z
dc.date.available2011-08-18T18:21:02Z
dc.date.issued2009-03-23en_US
dc.identifier.citationNoh, J.; Fessler, J.A.; Kinahan, P.E. (2009). "Statistical Sinogram Restoration in Dual-Energy CT for PET Attenuation Correction." IEEE Transactions on Medical Imaging 28(11): 1688-1702. <http://hdl.handle.net/2027.42/85900>en_US
dc.identifier.issn0278-0062en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85900
dc.description.abstractDual-energy (DE) X-ray computed tomography (CT) has been found useful in various applications. In medical imaging, one promising application is using low-dose DECT for attenuation correction in positron emission tomography (PET). Existing approaches to sinogram material decomposition ignore noise characteristics and are based on logarithmic transforms, producing noisy component sinogram estimates for low-dose DECT. In this paper, we propose two novel sinogram restoration methods based on statistical models: penalized weighted least square (PWLS) and penalized likelihood (PL), yielding less noisy component sinogram estimates for low-dose DECT than classical methods. The proposed methods consequently provide more precise attenuation correction of the PET emission images than do previous methods for sinogram material decomposition with DECT. We report simulations that compare the proposed techniques and existing approaches.en_US
dc.publisherIEEEen_US
dc.titleStatistical Sinogram Restoration in Dual-Energy CT for PET Attenuation Correctionen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science. Department of Radiology.en_US
dc.identifier.pmid19336292en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85900/1/Fessler11.pdf
dc.identifier.doi10.1109/TMI.2009.2018283en_US
dc.identifier.sourceIEEE Transactions on Medical Imagingen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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