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Penalized-Likelihood Image Reconstruction for Digital Holography

dc.contributor.authorSotthivirat, Saowapaken_US
dc.contributor.authorFessler, Jeffrey A.en_US
dc.date.accessioned2011-08-18T18:21:06Z
dc.date.available2011-08-18T18:21:06Z
dc.date.issued2004-05en_US
dc.identifier.citationSotthivirat, S.; Fessler, J. A. (2004). "Penalized-Likelihood Image Reconstruction for Digital Holography." Journal of the Optical Society of America A 21(5): 737-750. <http://hdl.handle.net/2027.42/85917>en_US
dc.identifier.issn1084-7529 1520-8532 (Online)en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85917
dc.description.abstractConventional numerical reconstruction for digital holography using a filter applied in the spatial-frequency domain to extract the primary image may yield suboptimal image quality because of the loss in high-frequency components and interference from other undesirable terms of a hologram. We propose a new numerical reconstruction approach using a statistical technique. This approach reconstructs the complex field of the object from the real-valued hologram intensity data. Because holographic image reconstruction is an ill-posed problem, our statistical technique is based on penalized-likelihood estimation. We develop a Poisson statistical model for this problem and derive an optimization transfer algorithm that monotonically decreases the cost function at each iteration. Simulation results show that our statistical technique has the potential to improve image quality in digital holography relative to conventional reconstruction techniques.en_US
dc.publisherOptical Society of Americaen_US
dc.titlePenalized-Likelihood Image Reconstruction for Digital Holographyen_US
dc.typearticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationotherNational Electronics and Computer Development Center, National Science and Technology Development Agency, Ministry of Science and Technology, Klong Luang, Pathumthani 12120, Thailand.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85917/1/Fessler60.pdf
dc.identifier.doi10.1364/JOSAA.21.000737en_US
dc.identifier.sourceJournal of the Optical Society of America Aen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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