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Maximum-Likelihood Dual-Energy TomographicImage Reconstruction

dc.contributor.authorFessler, Jeffrey A.en_US
dc.contributor.authorElbakri, Idris A.en_US
dc.contributor.authorSukovic, Predragen_US
dc.contributor.authorClinthorne, Neal H.en_US
dc.date.accessioned2011-08-18T18:21:09Z
dc.date.available2011-08-18T18:21:09Z
dc.date.issued2002-02-25en_US
dc.identifier.citationFessler, J. A.; Elbakri, I.; Sukovic, P.; Clinthorne, N. H. (2002). "Maximum-Likelihood Dual-Energy TomographicImage Reconstruction." Proc. O SPIE. Medical Imaging: Image Processing 4684: 38-49. <http://hdl.handle.net/2027.42/85934>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85934
dc.description.abstractDual-energy (DE) X-ray computed tomography (CT) has shown promise for material characterization and for providing quantitatively accurate CT values in a variety of applications. However, DE-CT has not been used routinely in medicine to date, primarily due to dose considerations. Most methods for DE-CT have used the filtered backprojection method for image reconstruction, leading to suboptimal noise/dose properties. This paper describes a statistical (maximum-likelihood) method for dual-energy X-ray CT that accommodates a wide variety of potential system configurations and measurement noise models. Regularized methods (such as penalized-likelihood or Bayesian estimation) are straightforward extensions. One version of the algorithm monotonically decreases the negative log-likelihood cost function each iteration. An ordered-subsets variation of the algorithm provides a fast and practical version.en_US
dc.publisherSPIEen_US
dc.titleMaximum-Likelihood Dual-Energy TomographicImage Reconstructionen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumEECS Department.BME Department.Division of Nuclear Medicine, Dept. of Radiology.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85934/1/Fessler172.pdf
dc.identifier.doi10.1117/12.467189en_US
dc.identifier.sourceProc. Of SPIE. Medical Imaging: Image Processingen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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