Cramér Rao Bound Analysis of Joint B1/T1 Mapping Methods in MRI
dc.contributor.author | Funai, Amanda K. | en_US |
dc.contributor.author | Fessler, Jeffrey A. | en_US |
dc.date.accessioned | 2011-08-18T18:21:17Z | |
dc.date.available | 2011-08-18T18:21:17Z | |
dc.date.issued | 2010-04-14 | en_US |
dc.identifier.citation | Funai, A.; Fessler, J.A. (2010). "Cramér Rao Bound Analysis of Joint B1/T1 Mapping Methods in MRI." IEEE International Symposium on Biomedical Imaging: From Nano to Macro: 712-715. <http://hdl.handle.net/2027.42/85982> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/85982 | |
dc.description.abstract | In MRI, RF field inhomogeneity (B1) and relaxation effects (T1) significantly affect both B1 and T1 mapping. Simultaneous joint estimation of both B1 and T1 has the potential to greatly improve both B1 and T1 estimation. This paper analyzes the Crame?r Rao Bound for joint B1, T1 estimation using common B1 and T1 pulse sequences. This analysis aids choosing pulse sequences and parameters given desired levels of B1 and T1 accuracy and the inherent trade off between the two mappings. | en_US |
dc.publisher | IEEE | en_US |
dc.title | Cramér Rao Bound Analysis of Joint B1/T1 Mapping Methods in MRI | en_US |
dc.type | article | en_US |
dc.subject.hlbsecondlevel | Biomedical Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | EECS Dept. | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/85982/1/Fessler248.pdf | |
dc.identifier.doi | 10.1109/ISBI.2010.5490075 | en_US |
dc.identifier.source | IEEE International Symposium on Biomedical Imaging: From Nano to Macro | en_US |
dc.owningcollname | Electrical Engineering and Computer Science, Department of (EECS) |
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