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Feasibility Study of Compton Scattering Enchanced Multiple Pinhole Imager for Nuclear Medicine

dc.contributor.authorMeng, L. J.en_US
dc.contributor.authorRogers, W. L.en_US
dc.contributor.authorClinthorne, N. H.en_US
dc.contributor.authorFessler, Jeffrey A.en_US
dc.date.accessioned2011-08-18T18:21:22Z
dc.date.available2011-08-18T18:21:22Z
dc.date.issued2003-10-14en_US
dc.identifier.citationMeng, L.J.; Rogers, W.L.; Clinthorne, N.H.; Fessler, J.A. (2003). "Feasibility Study of Compton Scattering Enchanced Multiple Pinhole Imager for Nuclear Medicine." IEEE Transactions on Nuclear Science 50(5): 1609-1617. <http://hdl.handle.net/2027.42/86012>en_US
dc.identifier.issn0018-9499en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/86012
dc.description.abstractThis paper presents a feasibility study of a Compton scattering enhanced (CSE) multiple pinhole imaging system for gamma rays with energy of 140 keV or higher. This system consists of a multiple-pinhole collimator, a position sensitive scintillation detector as used in a standard gamma camera, and a Si pad detector array, inserted between the collimator and the scintillation detector. The problem of multiplexing, normally associated with multiple pinhole system, is reduced by using the extra information from the detected Compton scattering events. In order to compensate for the sensitivity loss, due to the low probability of detecting Compton scattered events, the proposed detector is designed to collect both Compton scattering and non-Compton events. It has been shown that with properly selected pinhole spacing, the proposed detector design leads to an improved image quality.en_US
dc.publisherIEEEen_US
dc.titleFeasibility Study of Compton Scattering Enchanced Multiple Pinhole Imager for Nuclear Medicineen_US
dc.typearticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Radiology.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/86012/1/Fessler64.pdf
dc.identifier.doi10.1109/TNS.2003.817956en_US
dc.identifier.sourceIEEE Transactions on Nuclear Scienceen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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