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Gradient Based Image Registration Using Importance Sampling

dc.contributor.authorBhagalia, Roshni R.en_US
dc.contributor.authorFessler, Jeffrey A.en_US
dc.contributor.authorKim, Boklyeen_US
dc.date.accessioned2011-08-18T18:21:23Z
dc.date.available2011-08-18T18:21:23Z
dc.date.issued2006-04-06en_US
dc.identifier.citationBhagalia, R.; Fessier, J.A.; Kim, B. (2006). "Gradient Based Image Registration Using Importance Sampling." IEEE International Symposium on Biomedical Imaging: Nano to Macro: 446-449. <http://hdl.handle.net/2027.42/86019>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/86019
dc.description.abstractAnalytical gradient based non-rigid image registration methods, using intensity based similarity measures (e.g. mutual information), have proven to be capable of accurately handling many types of deformations. While their versatility is largely in part to their high degrees of freedom, the computation of the gradient of the similarity measure with respect to the many warp parameters becomes very time consuming. Recently, a simple stochastic approximation method using a small random subset of image pixels to approximate this gradient has been shown to be effective. We propose to use importance sampling to improve the accuracy and reduce the variance of this approximation by preferentially selecting pixels near image edges. Initial empirical results show that a combination of stochastic approximation methods and importance sampling greatly improves the rate of convergence of the registration process while preserving accuracy.en_US
dc.publisherIEEEen_US
dc.titleGradient Based Image Registration Using Importance Samplingen_US
dc.typearticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumEECS Department. Radiology Department.en_US
dc.identifier.pmid17354782en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/86019/1/Fessler217.pdf
dc.identifier.doi10.1109/ISBI.2006.1624949en_US
dc.identifier.sourceIEEE International Symposium on Biomedical Imaging: Nano to Macroen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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