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Detection of Methyl Radicals in a Flat Flame by Degenerate Four-Wave Mixing

dc.contributor.authorSick, Volkeren_US
dc.contributor.authorBui-Pham, Mary N.en_US
dc.contributor.authorFarrow, Roger L.en_US
dc.date.accessioned2011-11-07T18:54:45Z
dc.date.available2011-11-07T18:54:45Z
dc.date.issued1995-10-01en_US
dc.identifier.citationSick, V.; Bui-Pham; M. N.; Farrow, R. L. (1995). Detection of Methyl Radicals in a Flat Flame by Degenerate Four-Wave Mixing." Optics Letters 20(19): 2036-2038. <http://hdl.handle.net/2027.42/86762>en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/86762
dc.description.abstractWe report the spatially resolved detection of methyl radicals in a methane–air f lat flame, using degenerate four-wave mixing (DFWM). A frequency-tripled dye laser pumped with a frequency-doubled Nd:YAG laser was used to access the Herzberg b1 band of methyl near 216 nm. Using a nearly phase-conjugate geometry, we detected methyl with high spatial resolution [0.2 mm (0.3 mm) vertical (horizontal) and ,6 mm longitudinal] and with good signal-to-noise ratio in a rich sf _ 1.55d flame. Compared with laser absorption spectra, DFWM spectra were much less influenced by a broad featureless background. From the absorption data, we measured the peak methyl concentration to be 650 parts in 106, resulting in an estimated DFWM detection limit of 65 parts in 106.en_US
dc.publisherOptical Society of Americaen_US
dc.titleDetection of Methyl Radicals in a Flat Flame by Degenerate Four-Wave Mixingen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelMechanical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Mechanical Engineeringen_US
dc.contributor.affiliationotherCombustion Research Facility, MS 9057, Sandia National Laboratories, Livermore, California 94551.en_US
dc.identifier.pmid19862242en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/86762/1/Sick48.pdf
dc.identifier.doi10.1364/OL.20.002036en_US
dc.identifier.sourceOptics Lettersen_US
dc.owningcollnameMechanical Engineering, Department of


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