Show simple item record

Simultaneous Electrical and Thermal Modeling of a Contact-Type RF MEMS Switch

dc.contributor.authorJensen, Brian D.en_US
dc.contributor.authorWang, Zhongdeen_US
dc.contributor.authorSaitou, Kazuhiroen_US
dc.contributor.authorVolakis, John Leonidasen_US
dc.contributor.authorKurabayashi, Katsuoen_US
dc.date.accessioned2011-11-14T16:30:24Z
dc.date.available2011-11-14T16:30:24Z
dc.date.issued2003-11-15en_US
dc.identifier.citationJensen, B.; Wang, Z.; Saitou, K.; Volakis, J. Kurabayashi, K. (2003). Simultaneous Electrical and Thermal Modeling of a Contact-Type RF MEMS Switch." Proceedings of the ASME International Mechanical Engineering Congress and RandD Expo IMECE2003-41422: 225-228. <http://hdl.handle.net/2027.42/87230>en_US
dc.identifier.isbn0-7918-3721-1en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87230
dc.description.abstractImproving the power handling capability of direct contact RF MEMS switches requires a knowledge of conditions at the contact. This paper models the temperature rise in a direct contact RF MEMS switch, including the effects of electrical and thermal contact resistance. The maximum temperature in the beam is found to depend strongly on the power dissipation at the contact, with almost no contribution from dissipation due to currents in the rest of the switch. Moreover, the maximum temperature is found to exceed the limit for metal softening for a significant range of values of thermal and electrical contact resistance. Since local contact asperity temperature can be hundreds of degrees higher than the bulk material temperature modeled here, these results underscore the importance of understanding and controlling thermal and electrical contact resistance in the switch.en_US
dc.publisherASMEen_US
dc.titleSimultaneous Electrical and Thermal Modeling of a Contact-Type RF MEMS Switchen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelMechanical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Mechanical Engineeringen_US
dc.contributor.affiliationumElectrical Engineering and Computer Scienceen_US
dc.contributor.affiliationotherDepartment of Electrical Engineering Ohio State University Columbus, OH 43210en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87230/4/Saitou89.pdf
dc.identifier.doi10.1115/IMECE2003-41422en_US
dc.identifier.sourceProceedings of the ASME International Mechanical Engineering Congress and RandD Expoen_US
dc.owningcollnameMechanical Engineering, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.