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A self-controlled microcontrolled microvalve

dc.contributor.authorRich, C. A.en_US
dc.contributor.authorWise, K. D. (Kensall D.)en_US
dc.date.accessioned2011-11-15T16:03:36Z
dc.date.available2011-11-15T16:03:36Z
dc.date.issued1998-11-24en_US
dc.identifier.citationRich, C. A.; Wise, K. D. (1998). "A self-controlled microcontrolled microvalve." AIP Conference Proceedings 449(1): 937-941. <http://hdl.handle.net/2027.42/87556>en_US
dc.identifier.otherAPCPCS-449-1en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87556
dc.description.abstractIntegrated microvalves are needed for a broad range of semiconductor-processing-related applications. These include precision mass microflow controllers (μFCs) for dry etch systems, miniature gas chromatography systems for real-time monitoring, point-of-use semiconductor process reactant generators, and compact control systems for mini-environments. This paper reports a pneumatically actuated, integrated silicon microvalve, which was developed as a forerunner to an 8b μFC intended for the precision control of semiconductor process gases in the range from 0.1 to 10 sccm. The structure was designed to be batch-fabricated and compatible with on-chip thermopneumatic actuation. Assembled single-bit μFC devices achieve the targeted flow rate of 5 sccm (determined by an in-line flow channel) at 20 psid (1034 torr). The valve alone may achieve significantly higher flow rates. The leak rate is 0.08 sccm under 26.1 psig actuation pressure, and the valve can seal against pressures greater than 29 psid (1500 torr). © 1998 American Institute of Physics.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleA self-controlled microcontrolled microvalveen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Integrated Sensors and Circuits, Department of EECS, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87556/2/937_1.pdf
dc.identifier.doi10.1063/1.56891en_US
dc.identifier.sourceThe 1998 international conference on characterization and metrology for ULSI technologyen_US
dc.owningcollnamePhysics, Department of


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