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Large Volume HgI2 Gamma‐Ray Spectrometers
dc.contributor.authorHe, Zhongen_US
dc.contributor.authorBaciak, Jamesen_US
dc.date.accessioned2011-11-15T16:04:09Z
dc.date.available2011-11-15T16:04:09Z
dc.date.issued2002-10-10en_US
dc.identifier.citationHe, Zhong; Baciak, James (2002). "Large Volume HgI2 Gamma‐Ray Spectrometers." AIP Conference Proceedings 632(1): 113-117. <http://hdl.handle.net/2027.42/87582>en_US
dc.identifier.otherAPCPCS-632-1en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87582
dc.description.abstractThis paper demonstrates the enhanced capability of single polarity charge sensing, the 3‐dimensional position sensing technique, developed at the University of Michigan and previously successfully demonstrated on CdZnTe detectors, to improve the spectroscopic performance of HgI2 and to extend its range for spectrometry to an unprecedented thickness of 10 mm. Energy resolutions of close to 1% FWHM at 662 keV gamma‐ray energy were obtained from individual depth locations underneath pixel anodes, and 1.4–2.0% FWHM energy resolutions from 5 out of 6 tested pixel anodes on two 10 mm thick detectors. © 2002 American Institute of Physicsen_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleLarge Volume HgI2 Gamma‐Ray Spectrometersen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumNuclear Engineering and Radiological Sciences Department, The University of Michigan, Ann Arbor, Michigan 48109‐2104en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87582/2/113_1.pdf
dc.identifier.doi10.1063/1.1513959en_US
dc.identifier.sourceUNATTENDED RADIATION SENSOR SYSTEMS FOR REMOTE APPLICATIONSen_US
dc.owningcollnamePhysics, Department of


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