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Experience with a fluorescence‐based beam position monitor at the APS

dc.contributor.authorDufresne, E. M.en_US
dc.contributor.authorGuzman, J. A.en_US
dc.contributor.authorDierker, S. B.en_US
dc.contributor.authorClarke, Royen_US
dc.contributor.authorArms, D. A.en_US
dc.contributor.authorWalko, D. A.en_US
dc.date.accessioned2011-11-15T16:05:52Z
dc.date.available2011-11-15T16:05:52Z
dc.date.issued2004-05-12en_US
dc.identifier.citationDufresne, E. M.; Guzman, J. A.; Dierker, S. B.; Clarke, R.; Arms, D. A.; Walko, D. A. (2004). "Experience with a fluorescence‐based beam position monitor at the APS." AIP Conference Proceedings 705(1): 679-682. <http://hdl.handle.net/2027.42/87659>en_US
dc.identifier.otherAPCPCS-705-1en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87659
dc.description.abstractWe have recently redesigned the first crystal mount of our cryogenically cooled monochromator to reduce its sensitivity to pressure fluctuations in the cryogenic lines feeding the Si (111) crystal. With the use of a fluorescence‐based X‐ray beam position monitor (BPM) placed 19 m away from the monochromator, much operational experience has been gained on the sensitivity of the beam position and intensity to small changes in the cooling system. In this presentation, we will describe our X‐ray BPM design and performance and will provide examples of changes that have made the beam position more stable on our beamline. One such change for example has been the top‐up operation of the Advanced Photon Source (APS), which has reduced the thermal drifts associated with the ring current decay. © 2004 American Institute of Physicsen_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleExperience with a fluorescence‐based beam position monitor at the APSen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87659/2/679_1.pdf
dc.identifier.doi10.1063/1.1757887en_US
dc.identifier.sourceSYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentationen_US
dc.owningcollnamePhysics, Department of


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