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An Imaging System for Focusing Tests of Li Multiprism X‐ray Refractive Lenses
dc.contributor.authorDufresne, E. M.en_US
dc.contributor.authorArms, D. A.en_US
dc.contributor.authorPereira, N. R.en_US
dc.contributor.authorIlinski, P.en_US
dc.contributor.authorClarke, Royen_US
dc.date.accessioned2011-11-15T16:05:54Z
dc.date.available2011-11-15T16:05:54Z
dc.date.issued2004-05-12en_US
dc.identifier.citationDufresne, E. M.; Arms, D. A.; Pereira, N. R.; Ilinski, P.; Clarke, R. (2004). "An Imaging System for Focusing Tests of Li Multiprism X‐ray Refractive Lenses." AIP Conference Proceedings 705(1): 780-783. <http://hdl.handle.net/2027.42/87661>en_US
dc.identifier.otherAPCPCS-705-1en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87661
dc.description.abstractFor rapid and efficient tests of novel X‐rays optics, such as lithium‐based compound refractive lenses, we have built a fast X‐ray sensitive CCD imaging system. We report on the linearity, response and resolution of the microscope‐based imaging system. For the low magnifications used here (X2‐X10), we find that a thinly doped YAG screen has a poorer resolution than a thick YAG screen. We provide an example of its use in testing a new 2D focusing multiprism X‐ray lens. © 2004 American Institute of Physicsen_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleAn Imaging System for Focusing Tests of Li Multiprism X‐ray Refractive Lensesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87661/2/780_1.pdf
dc.identifier.doi10.1063/1.1757912en_US
dc.identifier.sourceSYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentationen_US
dc.owningcollnamePhysics, Department of


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