Show simple item record

Pulsed laser ignition of reactive multilayer films

dc.contributor.authorPicard, Yoosuf N.en_US
dc.contributor.authorAdams, David P.en_US
dc.contributor.authorPalmer, Jeremy A.en_US
dc.contributor.authorYalisove, Steven M.en_US
dc.date.accessioned2011-11-15T16:08:19Z
dc.date.available2011-11-15T16:08:19Z
dc.date.issued2006-04-03en_US
dc.identifier.citationPicard, Yoosuf N.; Adams, David P.; Palmer, Jeremy A.; Yalisove, Steven M. (2006). "Pulsed laser ignition of reactive multilayer films." Applied Physics Letters 88(14): 144102-144102-3. <http://hdl.handle.net/2027.42/87770>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87770
dc.description.abstractNanostructured Al/PtAl∕Pt multilayer films were ignited by single pulse irradiation from a Ti:sapphire femtosecond laser system. Critical ignition fluences (0.9–22 J/cm2)(0.9–22J∕cm2) required to initiate a self-propagating reaction were quantified for different multilayer designs. Multilayers with smaller bilayer thickness required relatively lower fluence for ignition. Ignition threshold fluence was also found to be 1.4–3.6 times higher for Al-capped multilayers than for Pt-capped multilayers. Ablation threshold fluences were measured for Al (860±70 mJ/cm2)(860±70mJ∕cm2) and Pt (540±50 mJ/cm2)(540±50mJ∕cm2) and related to the observed difference in ignition fluences for Al- and Pt-capped multilayers.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titlePulsed laser ignition of reactive multilayer filmsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 2300 Hayward Street, Ann Arbor, Michigan 48109-2136en_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 2300 Hayward Street, Ann Arbor, Michigan 48109-2136en_US
dc.contributor.affiliationotherSandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87770/2/144102_1.pdf
dc.identifier.doi10.1063/1.2191952en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceJ. J. Moore and H. J. Feng, Prog. Mater. Sci. 39, 243 (1995).en_US
dc.identifier.citedreferenceJ. A. Floro, J. Vac. Sci. Technol. A 4, 631 (1986).en_US
dc.identifier.citedreferenceE. Ma, C. V. Thompson, L. A. Clevenger, and K. N. Tu, Appl. Phys. Lett. 57, 1262 (1990).en_US
dc.identifier.citedreferenceM. E. Reiss, C. M. Esber, D. Van Heerden, A. J. Gavens, M. E. Williams, and T. P. Weihs, Mater. Sci. Eng., A 261, 217 (1999).en_US
dc.identifier.citedreferenceA. S. Rogachev, A. E. Grigoryan, E. V. Illarionova, I. G. Kanel, A. G. Merzhanov, A. N. Nosyrev, N. V. Sachkova, V. I. Khvesyuk, and P. A. Tsygankov, Combust., Explos. Shock Waves 40, 166 (2004).en_US
dc.identifier.citedreferenceJ. Wang, E. Besnoin, A. Duckham, S. J. Spey, M. E. Reiss, O. M. Knio, M. Powers, M. Whitener, and T. P. Weihs, Appl. Phys. Lett. 83, 3987 (2003).en_US
dc.identifier.citedreferenceC. Suryanarayana, J. J. Moore, and R. P. Radtke, Adv. Mater. Proces. 159, 29 (2001).en_US
dc.identifier.citedreferenceM. Monagheddu, N. Bertolino, P. Giuliani, C. Zanotti, and U. Anselmi Tamburini, J. Appl. Phys. 92, 594 (2002).en_US
dc.identifier.citedreferenceN. Bertolino, M. Monagheddu, A. Tacca, P. Giuliani, C. Zanotti, and U. Anselmi Tamburini, Intermetallics 11, 41 (2003).en_US
dc.identifier.citedreferenceC. Wang, L. Gao, G. Li, Y. Wang, Y. Xia, S. Bysakh, and C. Dong, J. Mater. Sci. 38, 1377 (2003).en_US
dc.identifier.citedreferenceF. Roeske, J. Benterou, R. Lee, and E. Roos, Propellants, Explos., Pyrotech. 28, 53 (2003).en_US
dc.identifier.citedreferenceY. N. Picard, H. H. Liu, S. J. Speys, J. P. McDonald, D. P. Adams, T. P. Weihs, and S. M. Yalisove, Mater. Res. Soc. Symp. Proc. 800, 387 (2004).en_US
dc.identifier.citedreferenceY. N. Picard, D. P. Adams, and S. M. Yalisove, Mater. Res. Soc. Symp. Proc. 850, 115 (2005).en_US
dc.identifier.citedreferenceF. R. De Boer, R. Boom, W. C. M. Mattens, A. R. Miedema, and A. K. Niessen, Cohesion in Metals: Transition Metal Alloys (North-Holland, New York, 1988).en_US
dc.identifier.citedreferenceWe compensate for the difference in Al and Pt densities when determining thicknesses. Densities were determined in separate x-ray reflectivity experiments, and both are found to be 97% of the bulk density.en_US
dc.identifier.citedreferenceRoot mean square roughness was measured using white-light interferometery (ADE Phase Shift, Tucson, AZ) to ensure roughness did not vary significantly.en_US
dc.identifier.citedreferenceK. Furusawa, K. Takahashi, H. Kumagai, K. Midorikawa, and M. Obara, Appl. Phys. A: Mater. Sci. Process. 69, S359 (1999).en_US
dc.identifier.citedreferenceS. Nolte, C. Momma, H. Jacobs, A. Tünnermann, B. N. Chichkov, B. Wellegehausen, and H. Welling, J. Opt. Soc. Am. B 14, 2716 (1997).en_US
dc.identifier.citedreferenceR. Le Harzic, D. Breitling, M. Weikert, S. Sommer, C. Föhl, F. Dausinger, S. Vallette, C. Donnet, and E. Audouard, Appl. Phys. A: Mater. Sci. Process. 80, 1589 (2005).en_US
dc.identifier.citedreferenceP. T. Mannion, J. Magee, E. Coyne, G. M. O’Connor, and T. J. Glynn, Appl. Surf. Sci. 223, 275 (2004).en_US
dc.identifier.citedreferenceY. Hirayama and M. Obara, J. Appl. Phys. 97, 064903 (2005).en_US
dc.identifier.citedreferenceM. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, Cambridge, 1999).en_US
dc.identifier.citedreferenceD. R. Lide, CRC Handbook of Chemistry and Physics, 85th ed. (CRC, Boca Raton, 2004) and optical constants therein.en_US
dc.identifier.citedreferenceT. W. Barbee and T. P. Weihs, U.S. Patent No. 5,538,795 (23 July 1996).en_US
dc.identifier.citedreferenceD. P. Adams, M. A. Rodriguez, C. Tigges, and P. Kotula, J. Mater. Res. (submitted).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.