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Moments-based tight-binding calculations of local electronic structure in InAs/GaAs quantum dots for comparison to experimental measurements

dc.contributor.authorLu, Jun-Qiangen_US
dc.contributor.authorJohnson, H. T.en_US
dc.contributor.authorDasika, Vaishno Devien_US
dc.contributor.authorGoldman, R. S.en_US
dc.date.accessioned2011-11-15T16:08:29Z
dc.date.available2011-11-15T16:08:29Z
dc.date.issued2006-01-30en_US
dc.identifier.citationLu, Jun-Qiang; Johnson, H. T.; Dasika, V. D.; Goldman, R. S. (2006). "Moments-based tight-binding calculations of local electronic structure in InAs/GaAs quantum dots for comparison to experimental measurements." Applied Physics Letters 88(5): 053109-053109-3. <http://hdl.handle.net/2027.42/87778>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87778
dc.description.abstractLocal electronic properties of InAs/GaAsInAs∕GaAs nanostructures are studied using a real-space moments method sp3d5s*sp3d5s* tight-binding approach. The order (N)(N) method is unique because it allows for accurate and highly resolved determination of local density of states that accounts for local strain, disorder, and defects, without diagonalization of the full tight-binding Hamiltonian. The effects of free surfaces and strain are first investigated by considering pure, cuboidal GaAs nanostructures. The quantum confinement in an embedded InAs quantum dot is then shown directly through the local densities of states projected on different atoms in the structure. The relationship between effective energy band gap and quantum dot size is mapped onto a simple equation. Finally, the real-space study is applied to quantum dot structures observed experimentally using scanning tunneling microscopy. Atomic positions are obtained from the images and used as input into the tight-binding calculations in order to study interfacial effects on the local electronic structure of real embedded quantum dots.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleMoments-based tight-binding calculations of local electronic structure in InAs/GaAs quantum dots for comparison to experimental measurementsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering and Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherDepartment of Mechanical and Industrial Engineering, University of Illinois, Urbana, Illinois 61801en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87778/2/053109_1.pdf
dc.identifier.doi10.1063/1.2171473en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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