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Accumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumping

dc.contributor.authorGiebink, N. C.en_US
dc.contributor.authorForrest, S. R.en_US
dc.date.accessioned2011-11-15T16:08:44Z
dc.date.available2011-11-15T16:08:44Z
dc.date.issued2006-11-06en_US
dc.identifier.citationGiebink, N. C.; Forrest, S. R. (2006). "Accumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumping." Applied Physics Letters 89(19): 193502-193502-3. <http://hdl.handle.net/2027.42/87790>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87790
dc.description.abstractThe recombination dynamics of geminate polaron pair (PP) states are investigated by monitoring electric-field-induced delayed fluorescence in thin films consisting of the green laser dye, Coumarin-6 (C6) doped at 1 wt %1wt% into 4,4′4,4′-bis(NN-carbazolyl)biphenyl. We find that the PP decay follows τ−mτ−m (with m ∼ 0.1m∼0.1), where ττ is the time that the PPs are held in the field. This sublinear decay suggests the possibility for accumulation of PPs over time that can then be reconverted into excitons upon field removal. We demonstrate the generation of short ( ∼ 50 ns∼50ns full width at half maximum) bursts of C6 fluorescence with peak intensities >20>20 times the steady-state fluorescence intensity (corresponding to a C6 singlet exciton density NS>4×1015 cm3NS>4×1015cm3) when pumped continuously by a low intensity (<1 W/cm2(<1W∕cm2) laser in the presence of a pulsed electric field.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleAccumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumpingen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109; Department of Physics, University of Michigan, Ann Arbor, Michigan 48109; and Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherPrinceton Institute for the Science and Technology of Materials (PRISM), Princeton University, Princeton, New Jersey 08544 and Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87790/2/193502_1.pdf
dc.identifier.doi10.1063/1.2385840en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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