Accumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumping
dc.contributor.author | Giebink, N. C. | en_US |
dc.contributor.author | Forrest, S. R. | en_US |
dc.date.accessioned | 2011-11-15T16:08:44Z | |
dc.date.available | 2011-11-15T16:08:44Z | |
dc.date.issued | 2006-11-06 | en_US |
dc.identifier.citation | Giebink, N. C.; Forrest, S. R. (2006). "Accumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumping." Applied Physics Letters 89(19): 193502-193502-3. <http://hdl.handle.net/2027.42/87790> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/87790 | |
dc.description.abstract | The recombination dynamics of geminate polaron pair (PP) states are investigated by monitoring electric-field-induced delayed fluorescence in thin films consisting of the green laser dye, Coumarin-6 (C6) doped at 1 wt %1wt% into 4,4′4,4′-bis(NN-carbazolyl)biphenyl. We find that the PP decay follows τ−mτ−m (with m ∼ 0.1m∼0.1), where ττ is the time that the PPs are held in the field. This sublinear decay suggests the possibility for accumulation of PPs over time that can then be reconverted into excitons upon field removal. We demonstrate the generation of short ( ∼ 50 ns∼50ns full width at half maximum) bursts of C6 fluorescence with peak intensities >20>20 times the steady-state fluorescence intensity (corresponding to a C6 singlet exciton density NS>4×1015 cm3NS>4×1015cm3) when pumped continuously by a low intensity (<1 W/cm2(<1W∕cm2) laser in the presence of a pulsed electric field. | en_US |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Accumulation of electric-field-stabilized geminate polaron pairs in an organic semiconductor to attain high excitation density under low intensity pumping | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109; Department of Physics, University of Michigan, Ann Arbor, Michigan 48109; and Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.contributor.affiliationother | Princeton Institute for the Science and Technology of Materials (PRISM), Princeton University, Princeton, New Jersey 08544 and Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/87790/2/193502_1.pdf | |
dc.identifier.doi | 10.1063/1.2385840 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
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dc.owningcollname | Physics, Department of |
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