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Growth and characteristics of ultralow threshold 1.45 μm1.45μm metamorphic InAs tunnel injection quantum dot lasers on GaAs

dc.contributor.authorMi, Zetianen_US
dc.contributor.authorBhattacharya, Pallab K.en_US
dc.contributor.authorYang, J.en_US
dc.date.accessioned2011-11-15T16:08:58Z
dc.date.available2011-11-15T16:08:58Z
dc.date.issued2006-10-09en_US
dc.identifier.citationMi, Z.; Bhattacharya, P.; Yang, J. (2006). "Growth and characteristics of ultralow threshold 1.45 μm1.45μm metamorphic InAs tunnel injection quantum dot lasers on GaAs." Applied Physics Letters 89(15): 153109-153109-3. <http://hdl.handle.net/2027.42/87801>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87801
dc.description.abstractThe molecular beam epitaxial growth and characteristics of 1.45 μm1.45μm metamorphic InAs quantum dot tunnel injection lasers on GaAs have been studied. Under optimized growth conditions, the quantum dots exhibit photoluminescence linewidths ∼ 30 meV∼30meV and high intensity at room temperature. The lasers are characterized by ultralow threshold current (63 A/cm2)(63A∕cm2), large frequency response (f−3 dB = 8 GHz)(f−3dB=8GHz), and near-zero αα parameter and chirp.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleGrowth and characteristics of ultralow threshold 1.45 μm1.45μm metamorphic InAs tunnel injection quantum dot lasers on GaAsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87801/2/153109_1.pdf
dc.identifier.doi10.1063/1.2358847en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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